Inventor
NAYAK SANDHYA
US3 patents
Patents
3 patentsUS11250205B2Feb 15, 2022
Performance characteristics of cartridge artifacts over text pattern constructs
IBM2 citations67
US11163942B1Nov 2, 2021
Supporting document and cross-document post-processing configurations and runtime execution within a single cartridge
IBM2 citations67
US11645452B2May 9, 2023
Performance characteristics of cartridge artifacts over text pattern constructs
IBM0 citations56