Inventor
LEE Chang-kyo
KR25 patents
Patents
25 patentsUS10923175B2Feb 16, 2021
Memory device adjusting duty cycle and memory system having the same
SAMSUNG ELECTRONICS CO LTD15 citations93
US11393522B2Jul 19, 2022
Memory device adjusting duty cycle and memory system having the same
SAMSUNG ELECTRONICS CO LTD6 citations85
US10566038B2Feb 18, 2020
Method of controlling on-die termination and system performing the same
SAMSUNG ELECTRONICS CO LTD8 citations84
US9508152B2Nov 29, 2016
Object learning and recognition method and system
SAMSUNG ELECTRONICS CO LTD5 citations84
US11423971B2Aug 23, 2022
Memory device adjusting duty cycle and memory system having the same
SAMSUNG ELECTRONICS CO LTD5 citations83
US10361699B2Jul 23, 2019
Memory modules, memory systems including the same, and methods of calibrating multi-die impedance of the memory modules
SAMSUNG ELECTRONICS CO LTD20 citations83
US10916279B2Feb 9, 2021
Method of controlling on-die termination and system performing the same
SAMSUNG ELECTRONICS CO LTD3 citations73
US10867405B2Dec 15, 2020
Object learning and recognition method and system
SAMSUNG ELECTRONICS CO LTD3 citations73
US10692554B2Jun 23, 2020
Method of controlling on-die termination and system performing the same
SAMSUNG ELECTRONICS CO LTD2 citations73
US10163215B2Dec 25, 2018
Object learning and recognition method and system
SAMSUNG ELECTRONICS CO LTD2 citations73
US12033686B2Jul 9, 2024
Memory device adjusting duty cycle and memory system having the same
SAMSUNG ELECTRONICS CO LTD1 citations72
US11749338B2Sep 5, 2023
Memory device adjusting duty cycle and memory system having the same
SAMSUNG ELECTRONICS CO LTD2 citations72
US11749337B2Sep 5, 2023
Memory device adjusting duty cycle and memory system having the same
SAMSUNG ELECTRONICS CO LTD2 citations72
US11211102B2Dec 28, 2021
Method and memory system for optimizing on-die termination settings of multi-ranks in a multi-rank memory device
SAMSUNG ELECTRONICS CO LTD4 citations72
US10885950B2Jan 5, 2021
Method and memory system for optimizing on-die termination settings of multi-ranks in a multi-rank memory device
SAMSUNG ELECTRONICS CO LTD3 citations72
US10725682B2Jul 28, 2020
Memory modules, memory systems and methods of operating memory modules
SAMSUNG ELECTRONICS CO LTD3 citations70
US9830960B2Nov 28, 2017
Data output circuit and memory device including the same
SAMSUNG ELECTRONICS CO LTD4 citations70
US9489764B2Nov 8, 2016
Method of generating three-dimensional (3D) volumetric data
SAMSUNG ELECTRONICS CO LTD2 citations63
US12106794B2Oct 1, 2024
Memory device adjusting duty cycle and memory system having the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US12020767B2Jun 25, 2024
Method and memory system for optimizing on-die termination settings of multi-ranks in a multi-rank memory device
SAMSUNG ELECTRONICS CO LTD0 citations62
US11475930B2Oct 18, 2022
Method of controlling on-die termination and system performing the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US10524004B2Dec 31, 2019
Content recommendation method and device
SAMSUNG ELECTRONICS CO LTD1 citations62
US11249662B2Feb 15, 2022
Memory modules, memory systems and methods of operating memory modules
SAMSUNG ELECTRONICS CO LTD1 citations59
US9690985B2Jun 27, 2017
Apparatus and method for recognizing object using depth image
SAMSUNG ELECTRONICS CO LTD0 citations52
US9767352B2Sep 19, 2017
Apparatus and method for analyzing body part association
SAMSUNG ELECTRONICS CO LTD0 citations42