Inventor
CHEN YIQIANG
CN13 patents
⚠️ This page may combine multiple inventors who share the name “CHEN YIQIANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH
6 patentsUS10732216B2Aug 4, 2020
Method and device of remaining life prediction for electromigration failure
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH2 citations70
US9952275B2Apr 24, 2018
Method and device of remaining life prediction for electromigration failure
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH3 citations70
US11231702B2Jan 25, 2022
Method, device and system for health monitoring of system-on-chip
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH0 citations46
US10458823B2Oct 29, 2019
System and method for health monitoring and early warning for electronic device
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH0 citations36
US10598713B2Mar 24, 2020
ESD failure early warning circuit for integrated circuit
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH0 citations33
US10503578B2Dec 10, 2019
On-chip TDDB degradation monitoring and failure early warning circuit for SoC
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH0 citations33
CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON
3 patentsUS12301097B2May 13, 2025
Fault prediction method and apparatus for power conversion device, and power conversion system
CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON0 citations53
US12066468B1Aug 20, 2024
Method and device for detecting system failure, computer device, and storage medium
CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON0 citations53
US12241948B2Mar 4, 2025
Asymmetric compensation method and apparatus for two-port near field probe, computer device, and storage medium
CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON0 citations40
CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES
2 patentsUS12494384B1Dec 9, 2025
Chip defect modifying device and method
CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES0 citations47
US12339310B1Jun 24, 2025
Method for monitoring degradation mechanism of switch device in power conversion circuit
CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES0 citations40