Inventor · disambiguated record
Miho Hirai
Also filed as: HIRAI MIHO
4 granted patents·1 pending application·60 citations·filing 1999–2006
75Inventor score
Top patents by PatentIndex Score
5 records- 0180US7282940B2Semiconductor device with electrode pads for test probeNEC ELECTRONICS CORP·Filed 2005·Granted Oct 16, 2007·13 cites·9 claims
- 0259US7595561B2Semiconductor device including multiple rows of peripheral circuit unitsNEC ELECTRONICS CORP·Filed 2006·Granted Sep 29, 2009·2 cites·7 claims
- 0357US6255882B1Method and system of switching clock signalNEC CORP·Filed 1999·Granted Jul 3, 2001·40 cites·10 claims
- 0448US7518242B2Semiconductor testing deviceNEC ELECTRONICS CORP·Filed 2004·Granted Apr 14, 2009·5 cites·18 claims
- 0537US2006170105A1Semiconductor device featuring probe area definition mark for defining probe area in electrode pad, and proof test system for proving proper contact of test probe with probe areaNEC ELECTRONICS CORP·Filed 2006·Application pending·0 cites
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