P

Inventor

CHIU YA-WEN

TW16 patents

Patents

16 patents
US11901442B2Feb 13, 2024

Method of manufacturing a semiconductor device and a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10804161B2Oct 13, 2020

CMOS FinFET structures including work-function materials having different proportions of crystalline orientations and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations70
US12518976B2Jan 6, 2026

Nitride-containing STI liner for SIGE channel

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12046479B2Jul 23, 2024

Nitride-containing STI liner for SiGe channel

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12197131B2Jan 14, 2025

Method for reducing line-end space in integrated circuit patterning

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11677015B2Jun 13, 2023

Method of manufacturing a semiconductor device and a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11635695B2Apr 25, 2023

Method for reducing line-end space in integrated circuit patterning

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations61
US12308369B2May 20, 2025

Method of manufacturing a semiconductor device and a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11961768B2Apr 16, 2024

CMOS FinFET structures including work-function materials having different proportions of crystalline orientations and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11682589B2Jun 20, 2023

CMOS finFET structures including work-function materials having different proportions of crystalline orientations and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12183573B2Dec 31, 2024

Device and method for high pressure anneal

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11854800B2Dec 26, 2023

Device and method for high pressure anneal

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US11037781B2Jun 15, 2021

Device and method for high pressure anneal

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US12581721B2Mar 17, 2026

Method for gap filling with selectively formed seed layer and heteroepitaxial cap layer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US12288715B2Apr 29, 2025

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11631612B2Apr 18, 2023

Semiconductor device and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47