P

Inventor

CHA SANG-UHN

KR52 patents
⚠️ This page may combine multiple inventors who share the name “CHA SANG-UHN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

46 patents
US10037244B2Jul 31, 2018

Semiconductor memory devices, memory systems including the same and methods of operating memory systems

SAMSUNG ELECTRONICS CO LTD23 citations94
US10002045B2Jun 19, 2018

Semiconductor memory devices having input/output gating circuit and memory systems including the same

SAMSUNG ELECTRONICS CO LTD38 citations94
US10846169B2Nov 24, 2020

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD7 citations84
US10705908B2Jul 7, 2020

Semiconductor memory devices, memory systems including the same and methods of operating memory systems

SAMSUNG ELECTRONICS CO LTD7 citations84
US10635535B2Apr 28, 2020

Semiconductor memory devices, memory systems, and methods of operating the semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD10 citations84
US10635531B2Apr 28, 2020

Semiconductor memory device error correction circuit, semiconductor memory device including the same, and memory system including the same

SAMSUNG ELECTRONICS CO LTD10 citations84
US10476529B2Nov 12, 2019

Error detection code generation circuits of semiconductor devices, memory controllers including the same and semiconductor memory devices including the same

SAMSUNG ELECTRONICS CO LTD9 citations84
US10127974B2Nov 13, 2018

Memory device and memory system performing request-based refresh, and operating method of the memory device

SAMSUNG ELECTRONICS CO LTD7 citations84
US10044475B2Aug 7, 2018

Characterization of in-chip error correction circuits and related semiconductor memory devices/memory systems

SAMSUNG ELECTRONICS CO LTD6 citations84
US9990163B2Jun 5, 2018

Methods of operating semiconductor memory devices with selective write-back of data for error scrubbing and related devices

SAMSUNG ELECTRONICS CO LTD7 citations84
US9940991B2Apr 10, 2018

Memory device and memory system performing request-based refresh, and operating method of the memory device

SAMSUNG ELECTRONICS CO LTD5 citations84
US9805827B2Oct 31, 2017

Semiconductor memory devices, memory systems including the same and methods of operating the same

SAMSUNG ELECTRONICS CO LTD9 citations84
US9727412B2Aug 8, 2017

Memory device having error notification function

SAMSUNG ELECTRONICS CO LTD10 citations84
US10521293B2Dec 31, 2019

Memory device for performing parallel read-modify-write operation

SAMSUNG ELECTRONICS CO LTD7 citations83
US9953725B2Apr 24, 2018

Semiconductor memory devices and methods of operating the same

SAMSUNG ELECTRONICS CO LTD16 citations83
US10811078B2Oct 20, 2020

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD5 citations82
US10404286B2Sep 3, 2019

Memory modules, memory systems including the same and methods of operating memory systems

SAMSUNG ELECTRONICS CO LTD7 citations82
US10204700B1Feb 12, 2019

Memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD10 citations79
US11231996B2Jan 25, 2022

Semiconductor memory devices, memory systems including the same and methods of operating memory systems

SAMSUNG ELECTRONICS CO LTD1 citations73
US10929225B2Feb 23, 2021

Semiconductor memory devices, memory systems including the same and methods of operating memory systems

SAMSUNG ELECTRONICS CO LTD2 citations73
US10884852B2Jan 5, 2021

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD4 citations73
US10868570B2Dec 15, 2020

Error detection code generation circuits of semiconductor devices, memory controllers including the same and semiconductor memory devices including the same

SAMSUNG ELECTRONICS CO LTD1 citations73
US10802912B2Oct 13, 2020

Semiconductor memory device and memory system having the same

SAMSUNG ELECTRONICS CO LTD3 citations73
US10573356B2Feb 25, 2020

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD6 citations73
US10355833B2Jul 16, 2019

Characterization of in-chip error correction circuits and related semiconductor memory devices/memory systems

SAMSUNG ELECTRONICS CO LTD3 citations73
US10255989B2Apr 9, 2019

Semiconductor memory devices, memory systems including the same and methods of operating the same

SAMSUNG ELECTRONICS CO LTD3 citations73
US10198221B2Feb 5, 2019

Methods of operating semiconductor memory devices with selective write-back of data for error scrubbing and related devices

SAMSUNG ELECTRONICS CO LTD4 citations73
US10671478B2Jun 2, 2020

Scrubbing controllers of semiconductor memory devices, semiconductor memory devices and methods of operating the same

SAMSUNG ELECTRONICS CO LTD3 citations72
US10614906B2Apr 7, 2020

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD5 citations72
US10156995B2Dec 18, 2018

Semiconductor memory devices and methods of operating the same

SAMSUNG ELECTRONICS CO LTD3 citations72
US10127102B2Nov 13, 2018

Semiconductor memory devices and memory systems including the same

SAMSUNG ELECTRONICS CO LTD3 citations72
US11557332B2Jan 17, 2023

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD1 citations71
US10586584B2Mar 10, 2020

Semiconductor semiconductor memory devices, memory systems and methods of operating memory devices

SAMSUNG ELECTRONICS CO LTD2 citations71
US11994948B2May 28, 2024

Semiconductor memory devices, memory systems including the same and methods of operating memory systems

SAMSUNG ELECTRONICS CO LTD0 citations63
US11593199B2Feb 28, 2023

Semiconductor memory devices, memory systems including the same and methods of operating memory systems

SAMSUNG ELECTRONICS CO LTD0 citations63
US11216339B2Jan 4, 2022

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD1 citations63
US11921579B2Mar 5, 2024

Method of operating memory device, method of operating memory controller and memory system

SAMSUNG ELECTRONICS CO LTD0 citations62
US11438016B2Sep 6, 2022

Error detection code generation circuits of semiconductor devices, memory controllers including the same and semiconductor memory devices including the same

SAMSUNG ELECTRONICS CO LTD0 citations62
US11385960B2Jul 12, 2022

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD1 citations62
US11239960B2Feb 1, 2022

Characterization of in-chip error correction circuits and related semiconductor memory devices/memory systems

SAMSUNG ELECTRONICS CO LTD0 citations62
US11223373B2Jan 11, 2022

Error detection code generation circuits of semiconductor devices, memory controllers including the same and semiconductor memory devices including the same

SAMSUNG ELECTRONICS CO LTD0 citations62
US11194657B2Dec 7, 2021

Semiconductor memory devices, memory systems, and methods of operating the semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD0 citations62
US10698763B2Jun 30, 2020

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD1 citations62
US10503589B2Dec 10, 2019

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD1 citations62
US11031065B2Jun 8, 2021

Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices

SAMSUNG ELECTRONICS CO LTD0 citations61
US10855412B2Dec 1, 2020

Characterization of in-chip error correction circuits and related semiconductor memory devices/memory systems

SAMSUNG ELECTRONICS CO LTD0 citations52

SK HYNIX INC

3 patents

CHA SANG-UHN

1 patent

Showing the top 50 of 52 patents by PatentIndex Score.