Inventor · disambiguated record
David L. Harmon
Also filed as: HARMON DAVID L · HARMON DAVID LAURANT
20 granted patents·576 citations·filing 1991–2013
96Inventor score
Top patents by PatentIndex Score
20 records- 0194US7067886B2Method of assessing potential for charging damage in SOI designs and structures for eliminating potential for damageIBM·Filed 2003·Granted Jun 27, 2006·95 cites·15 claims
- 0292US5330935ALow temperature plasma oxidation processIBM·Filed 1992·Granted Jul 19, 1994·151 cites·10 claims
- 0391US8492866B1Isolated Zener diodeANDERSON FREDERICK G·Filed 2012·Granted Jul 23, 2013·15 cites·23 claims
- 0487US5412246ALow temperature plasma oxidation processIBM·Filed 1994·Granted May 2, 1995·93 cites·8 claims
- 0586US7096450B2Enhancement of performance of a conductive wire in a multilayered substrateIBM·Filed 2003·Granted Aug 22, 2006·41 cites·18 claims
- 0673US8486796B2Thin film resistors and methods of manufactureHARMON DAVID L·Filed 2010·Granted Jul 16, 2013·4 cites·19 claims
- 0765US5118384AReactive ion etching buffer maskIBM·Filed 1991·Granted Jun 2, 1992·41 cites·9 claims
- 0864US5686345ATrench mask for forming deep trenches in a semiconductor substrate, and method of using sameIBM·Filed 1996·Granted Nov 11, 1997·29 cites·19 claims
- 0963US7132318B2Method of assessing potential for charging damage in SOI designs and structures for eliminating potential for damageIBM·Filed 2004·Granted Nov 7, 2006·9 cites·12 claims
- 1058US5618379ASelective deposition processIBM·Filed 1991·Granted Apr 8, 1997·24 cites·17 claims
- 1158US5204138APlasma enhanced CVD process for fluorinated silicon nitride filmsIBM·Filed 1991·Granted Apr 20, 1993·14 cites·12 claims
- 1255US8480302B2Micro-electro-mechanical-system temperature sensorGILL JASON P·Filed 2010·Granted Jul 9, 2013·1 cites·15 claims
- 1353US5298790AReactive ion etching buffer maskIBM·Filed 1992·Granted Mar 29, 1994·24 cites·13 claims
- 1451US8796108B2Isolated zener diode, an integrated circuit incorporating multiple instances of the zener diode, a method of forming the zener diode and a design structure for the zener diodeIBM·Filed 2013·Granted Aug 5, 2014·0 cites·19 claims
- 1549US5767017ASelective removal of vertical portions of a filmIBM·Filed 1995·Granted Jun 16, 1998·15 cites·34 claims
- 1647US7511378B2Enhancement of performance of a conductive wire in a multilayered substrateIBM·Filed 2006·Granted Mar 31, 2009·0 cites·3 claims
- 1745US5539154AFluorinated silicon nitride filmsIBM·Filed 1995·Granted Jul 23, 1996·8 cites·7 claims
- 1838US5714798ASelective deposition processIBM·Filed 1996·Granted Feb 3, 1998·6 cites·11 claims
- 1935US6139647ASelective removal of vertical portions of a filmIBM·Filed 1998·Granted Oct 31, 2000·5 cites·10 claims
- 2030US5462812AFluorinated silicon nitride filmsFiled 1992·Granted Oct 31, 1995·1 cites·6 claims
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