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Inventor
KARIMI FARZIN
US
2 patents
Patents
2 patents
US6574762B1
Jun 3, 2003
Use of a scan chain for configuration of BIST unit operation
LSI LOGIC CORP
142 citations
95
US6681358B1
Jan 20, 2004
Parallel testing of a multiport memory
LSI LOGIC CORP
67 citations
93