Inventor · disambiguated record
Joseph F. Wrinn
Also filed as: HOFFMAN MARK S · WRINN JOSEPH · WRINN JOSEPH F · WRINN JOSEPH FRANCIS
13 granted patents·314 citations·filing 1978–2018
92Inventor score
Top patents by PatentIndex Score
13 records- 0193US5631572APrinted circuit board tester using magnetic inductionTERADYNE INC·Filed 1994·Granted May 20, 1997·126 cites·29 claims
- 0291US9001456B2Engaging test slotsCAMPBELL PHILIP·Filed 2010·Granted Apr 7, 2015·25 cites·18 claims
- 0389US9977052B2Test fixtureTERADYNE INC·Filed 2016·Granted May 22, 2018·4 cites·24 claims
- 0483US4660197ACircuitry for synchronizing a multiple channel circuit testerTERADYNE INC·Filed 1985·Granted Apr 21, 1987·40 cites·18 claims
- 0582US4746855ARelay multiplexing for circuit testersTERADYNE INC·Filed 1987·Granted May 24, 1988·66 cites·7 claims
- 0679US7819581B2Method of and system for calibration of inspection systems producing X-ray imagesTERADYNE INC·Filed 2008·Granted Oct 26, 2010·13 cites·20 claims
- 0771US4178543AAnalyzing electrical circuit boardsTERADYNE INC·Filed 1978·Granted Dec 11, 1979·19 cites·25 claims
- 0868US10955465B2Method and apparatus for bond wire testing in an integrated circuitTERADYNE INC·Filed 2018·Granted Mar 23, 2021·1 cites·19 claims
- 0967US4176313AAnalyzing electrical circuit boardsTERADYNE INC·Filed 1978·Granted Nov 27, 1979·16 cites·30 claims
- 1060US8031929B2X-ray inspection of solder reflow in high-density printed circuit board applicationsTERADYNE INC·Filed 2008·Granted Oct 4, 2011·1 cites·19 claims
- 1144US7626175B2Method of and system for obtaining linear data for object scanned using non-collimated, poly-energetic X-raysTERADYNE INC·Filed 2008·Granted Dec 1, 2009·0 cites·20 claims
- 1238US10401423B2Thermal control using phase-change materialTERADYNE INC·Filed 2016·Granted Sep 3, 2019·0 cites·25 claims
- 1336US4176312AElectrical circuitry for measuring low level signalsTERADYNE INC·Filed 1978·Granted Nov 27, 1979·3 cites·6 claims
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