Inventor

HU LONG-JANG

TW2 patents

Patents

2 patents

US5992032ANov 30, 1999

Method and apparatus for inclination measurement using piezoelectric effect

CHUNG SHAN INST OF SCIENCE20 citations87

US6073355AJun 13, 2000

Method for inclination measurement using piezoelectric effect

CHUNG SHAN INST OF SCIENCE6 citations68