Inventor

TSUKADA SYUICHI

JP4 patents

⚠️ This page may combine multiple inventors who share the name “TSUKADA SYUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKYO ELECTRON LTD

2 patents

US7847569B2Dec 7, 2010

Probe device and method of regulating contact pressure between object to be inspected and probe

TOKYO ELECTRON LTD3 citations59

US7679385B2Mar 16, 2010

Probe card for inspecting electric properties of an object

TOKYO ELECTRON LTD2 citations59

KOMATSU SHIGEKAZU

1 patent

US8723544B2May 13, 2014

Structure of probe card for inspecting electrical characteristics of object to be inspected

KOMATSU SHIGEKAZU2 citations57

AMEMIYA TAKASHI

1 patent

US8063652B2Nov 22, 2011

Probing apparatus and method for adjusting probing apparatus

AMEMIYA TAKASHI4 citations54