P

Inventor

SEO SOON-CHEON

US179 patents
⚠️ This page may combine multiple inventors who share the name “SEO SOON-CHEON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

42 patents
US6503834B1Jan 7, 2003

Process to increase reliability CuBEOL structures

IBM79 citations98
US6573606B2Jun 3, 2003

Chip to wiring interface with single metal alloy layer applied to surface of copper interconnect

IBM307 citations97
US10297668B1May 21, 2019

Vertical transport fin field effect transistor with asymmetric channel profile

IBM18 citations94
US10115800B1Oct 30, 2018

Vertical fin bipolar junction transistor with high germanium content silicon germanium base

IBM17 citations94
US9397006B1Jul 19, 2016

Co-integration of different fin pitches for logic and analog devices

IBM25 citations94
US9330983B1May 3, 2016

CMOS NFET and PFET comparable spacer width

IBM18 citations93
US9431486B1Aug 30, 2016

Channel strain and controlling lateral epitaxial growth of the source and drain in FinFET devices

IBM13 citations92
US10804165B2Oct 13, 2020

Source and drain isolation for CMOS nanosheet with one block mask

IBM12 citations86
US10325820B1Jun 18, 2019

Source and drain isolation for CMOS nanosheet with one block mask

IBM14 citations86
US10672872B1Jun 2, 2020

Self-aligned base contacts for vertical fin-type bipolar junction transistors

IBM9 citations84
US10396126B1Aug 27, 2019

Resistive memory device with electrical gate control

IBM11 citations84
US10381074B1Aug 13, 2019

Differential weight reading of an analog memory element in crosspoint array utilizing current subtraction transistors

IBM10 citations84
US10347456B1Jul 9, 2019

Vertical vacuum channel transistor with minimized air gap between tip and gate

IBM8 citations84
US10347739B2Jul 9, 2019

Extended contact area using undercut silicide extensions

IBM5 citations84
US10256296B2Apr 9, 2019

Middle-of-line (MOL) capacitance reduction for self-aligned contact in gate stack

IBM5 citations84
US10236362B2Mar 19, 2019

Nanowire FET including nanowire channel spacers

IBM10 citations84
US9887289B2Feb 6, 2018

Method and structure of improving contact resistance for passive and long channel devices

IBM6 citations84
US9871099B2Jan 16, 2018

Nanosheet isolation for bulk CMOS non-planar devices

IBM6 citations84
US9704760B2Jul 11, 2017

Integrated circuit (IC) with offset gate sidewall contacts and method of manufacture

IBM6 citations84
US9685340B2Jun 20, 2017

Stable contact on one-sided gate tie-down structure

IBM17 citations84
US9673101B2Jun 6, 2017

Minimize middle-of-line contact line shorts

IBM4 citations84
US9595592B1Mar 14, 2017

Forming dual contact silicide using metal multi-layer and ion beam mixing

IBM11 citations84
US9577096B2Feb 21, 2017

Salicide formation on replacement metal gate finFet devices

IBM6 citations84
US9576961B2Feb 21, 2017

Semiconductor devices with sidewall spacers of equal thickness

IBM6 citations84
US9553093B1Jan 24, 2017

Spacer for dual epi CMOS devices

IBM10 citations84
US9520500B1Dec 13, 2016

Self heating reduction for analog radio frequency (RF) device

IBM5 citations84
US9502418B2Nov 22, 2016

Semiconductor devices with sidewall spacers of equal thickness

IBM5 citations84
US9461168B1Oct 4, 2016

Channel strain and controlling lateral epitaxial growth of the source and drain in FinFET devices

IBM8 citations84
US9449884B1Sep 20, 2016

Semiconductor device with trench epitaxy and contact

IBM7 citations84
US9362362B2Jun 7, 2016

FinFET with dielectric isolated channel

IBM6 citations84
US7211507B2May 1, 2007

PE-ALD of TaN diffusion barrier region on low-k materials

IBM15 citations84
US6539625B2Apr 1, 2003

Chromium adhesion layer for copper vias in low-k technology

IBM17 citations84
US10049876B1Aug 14, 2018

Removal of trilayer resist without damage to underlying structure

IBM5 citations83
US9443855B1Sep 13, 2016

Spacer formation on semiconductor device

IBM7 citations82
US12329045B2Jun 10, 2025

Phase change memory programming current leakage reduction

IBM2 citations75
US11600325B2Mar 7, 2023

Non volatile resistive memory logic device

IBM2 citations73
US10971585B2Apr 6, 2021

Gate spacer and inner spacer formation for nanosheet transistors having relatively small space between adjacent gates

IBM4 citations73
US10950549B2Mar 16, 2021

ILD gap fill for memory device stack array

IBM2 citations73
US10832941B2Nov 10, 2020

Airgap isolation for backend embedded memory stack pillar arrays

IBM3 citations73
US10833168B2Nov 10, 2020

Complementary metal-oxide-semiconductor (CMOS) nanosheet devices with epitaxial source/drains and replacement metal gate structures

IBM2 citations73
US10777679B2Sep 15, 2020

Removal of work function metal wing to improve device yield in vertical FETs

IBM4 citations73
US10763431B2Sep 1, 2020

Film stress control for memory device stack

IBM3 citations73

INFINEON TECHNOLOGIES AG

3 patents

GLOBALFOUNDRIES INC

2 patents

STANDAERT THEODORUS EDUARDUS

1 patent

SEO SOON-CHEON

1 patent

KELLY JAMES J

1 patent

Showing the top 50 of 179 patents by PatentIndex Score.