Inventor
JANG JIN-MO
KR4 patents
Patents
4 patentsUS7423444B2Sep 9, 2008
Digital test apparatus for testing analog semiconductor device(s)
SAMSUNG ELECTRONICS CO LTD2 citations57
US7268573B2Sep 11, 2007
Apparatus for generating test stimulus signal having current regardless of internal impedance changes of device under test
SAMSUNG ELECTRONICS CO LTD6 citations57
US6931349B2Aug 16, 2005
Jitter measuring system in high speed data output device and total jitter measuring method
SAMSUNG ELECTRONICS CO LTD2 citations56
US7610530B2Oct 27, 2009
Test data generator, test system and method thereof
SAMSUNG ELECTRONICS CO LTD0 citations46