Inventor

CHEN BI-JEN

TW3 patents

⚠️ This page may combine multiple inventors who share the name “CHEN BI-JEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

2 patents

US10393801B2Aug 27, 2019

Fault isolation system and method for detecting faults in a circuit

MICRON TECHNOLOGY INC3 citations66

US9784788B2Oct 10, 2017

Fault isolation system and method for detecting faults in a circuit

MICRON TECHNOLOGY INC0 citations45

CHEN BI-JEN

1 patent

US8426810B2Apr 23, 2013

Method of planar imaging on semiconductor chips using focused ion beam

CHEN BI-JEN0 citations23