Inventor · disambiguated record
Kouki Okawauchi
Also filed as: OKAWAUCHI KOUKI
3 granted patents·1 pending application·32 citations·filing 2000–2003
70Inventor score
Files withSONY CORP3
Top patents by PatentIndex Score
4 records- 0175US6337488B1Defect inspection apparatus and defect inspection methodSONY CORP·Filed 2000·Granted Jan 8, 2002·18 cites·20 claims
- 0270US6953939B2Testing apparatus using scanning electron microscopeSONY CORP·Filed 2003·Granted Oct 11, 2005·9 cites·3 claims
- 0360US6524871B2Defect inspection apparatus and defect inspection methodSONY CORP·Filed 2002·Granted Feb 25, 2003·5 cites·11 claims
- 0428US2002067490A1Pattern inspecting apparatus, pattern inspecting method, aligner, and method of manufacturing electronic deviceFiled 2001·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →