Inventor

WEIR BONNIE E

US6 patents

⚠️ This page may combine multiple inventors who share the name “WEIR BONNIE E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LSI CORP

2 patents

US8775994B2Jul 8, 2014

Using entire area of chip in TDDB checking

LSI CORP5 citations77

US8875070B2Oct 28, 2014

Breaking up long-channel field effect transistor into smaller segments for reliability modeling

LSI CORP5 citations67

KOOK TAEHO

2 patents

US8241986B2Aug 14, 2012

Semiconductor device and process for reducing damaging breakdown in gate dielectrics

KOOK TAEHO0 citations45

US8089130B2Jan 3, 2012

Semiconductor device and process for reducing damaging breakdown in gate dielectrics

KOOK TAEHO0 citations45

AGERE SYSTEMS INC

1 patent

US7332924B2Feb 19, 2008

Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure

AGERE SYSTEMS INC12 citations82

WEIR BONNIE E

1 patent

US8624352B2Jan 7, 2014

Mitigation of detrimental breakdown of a high dielectric constant metal-insulator-metal capacitor in a capacitor bank

WEIR BONNIE E0 citations44