Inventor
NAKAGAWA SEIICHI
JP30 patents
⚠️ This page may combine multiple inventors who share the name “NAKAGAWA SEIICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TDK CORP
15 patentsUS7458151B2Dec 2, 2008
Method of forming external electrode
TDK CORP19 citations83
US10643781B2May 5, 2020
Multilayer coil component
TDK CORP4 citations82
US10848119B2Nov 24, 2020
Electronic component
TDK CORP2 citations72
US12087484B2Sep 10, 2024
Multilayer coil component
TDK CORP0 citations62
US11710593B2Jul 25, 2023
Multilayer coil component
TDK CORP0 citations62
US12354785B2Jul 8, 2025
Multilayer coil component
TDK CORP0 citations61
US12176134B2Dec 24, 2024
Multilayer coil component
TDK CORP0 citations61
US12040111B2Jul 16, 2024
Multilayer coil component
TDK CORP0 citations61
US11817252B2Nov 14, 2023
Multilayer coil component
TDK CORP0 citations60
US11270833B2Mar 8, 2022
Multilayer coil component
TDK CORP0 citations60
US12525381B2Jan 13, 2026
Multilayer coil component
TDK CORP0 citations59
US12125627B2Oct 22, 2024
Multilayer inductor component
TDK CORP0 citations51
US12094642B2Sep 17, 2024
Multilayer inductor component
TDK CORP0 citations51
US11631530B2Apr 18, 2023
Multilayer coil component
TDK CORP0 citations51
US10784834B2Sep 22, 2020
Lamination type LC filter array
TDK CORP0 citations41
JEOL LTD
7 patentsUS6426501B1Jul 30, 2002
Defect-review SEM, reference sample for adjustment thereof, method for adjustment thereof, and method of inspecting contact holes
JEOL LTD105 citations98
US4419581ADec 6, 1983
Magnetic objective lens for use in a scanning electron microscope
JEOL LTD55 citations96
US4431915AFeb 14, 1984
Electron beam apparatus
JEOL LTD23 citations81
US4219732AAug 26, 1980
Magnetic electron lens
JEOL LTD19 citations81
US4547669AOct 15, 1985
Electron beam scanning device
JEOL LTD12 citations73
US4068145AJan 10, 1978
Insulated elastic support and clamping means for resistance heaters and emitter tip of electron gun
JEOL LTD12 citations66
US4283632AAug 11, 1981
Electron beam aperture device
JEOL LTD3 citations61