Inventor
RUSSELL DAVID J
US58 patents
⚠️ This page may combine multiple inventors who share the name “RUSSELL DAVID J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
46 patentsUS6542379B1Apr 1, 2003
Circuitry with integrated passive components and method for producing
IBM81 citations98
US6121069ASep 19, 2000
Interconnect structure for joining a chip to a circuit card
IBM66 citations96
US5026624AJun 25, 1991
Composition for photo imaging
IBM133 citations96
US5300402AApr 5, 1994
Composition for photo imaging
IBM100 citations94
US9401336B2Jul 26, 2016
Dual layer stack for contact formation
IBM48 citations93
US6391210B2May 21, 2002
Process for manufacturing a multi-layer circuit board
IBM17 citations93
US6080668AJun 27, 2000
Sequential build-up organic chip carrier and method of manufacture
IBM23 citations93
US5439766AAug 8, 1995
Composition for photo imaging
IBM96 citations93
US6706464B2Mar 16, 2004
Method of fabricating circuitized structures
IBM15 citations92
US6521844B1Feb 18, 2003
Through hole in a photoimageable dielectric structure with wired and uncured dielectric
IBM33 citations92
US6195264B1Feb 27, 2001
Laminate substrate having joining layer of photoimageable material
IBM30 citations92
US5953623ASep 14, 1999
Ball limiting metal mask and tin enrichment of high melting point solder for low temperature interconnection
IBM43 citations92
US6522014B1Feb 18, 2003
Fabrication of a metalized blind via
IBM23 citations91
US5439779AAug 8, 1995
Aqueous soldermask
IBM22 citations91
US5304457AApr 19, 1994
Composition for photo imaging
IBM20 citations91
US5278010AJan 11, 1994
Composition for photo imaging
IBM49 citations91
US5264325ANov 23, 1993
Composition for photo imaging
IBM36 citations91
US6423905B1Jul 23, 2002
Printed wiring board with improved plated through hole fatigue life
IBM15 citations84
US6361923B1Mar 26, 2002
Laser ablatable material and its use
IBM14 citations84
US4911786AMar 27, 1990
Method of etching polyimides and resulting passivation structure
IBM22 citations81
US6689543B2Feb 10, 2004
Laser ablatable material and its use
IBM12 citations74
US6290860B1Sep 18, 2001
Process for design and manufacture of fine line circuits on planarized thin film dielectrics and circuits manufactured thereby
IBM7 citations74
US10276534B2Apr 30, 2019
Reduction of solder interconnect stress
IBM2 citations73
US9913405B2Mar 6, 2018
Glass interposer with embedded thermoelectric devices
IBM2 citations73
US9613915B2Apr 4, 2017
Reduced-warpage laminate structure
IBM2 citations73
US9543255B2Jan 10, 2017
Reduced-warpage laminate structure
IBM3 citations73
US6835533B2Dec 28, 2004
Photoimageable dielectric epoxy resin system film
IBM5 citations73
US6528218B1Mar 4, 2003
Method of fabricating circuitized structures
IBM12 citations73
US6519843B2Feb 18, 2003
Method of forming a chip carrier by joining a laminate layer and stiffener
IBM12 citations73
US6576549B2Jun 10, 2003
Fabrication of a metalized blind via
IBM5 citations72
US9865557B1Jan 9, 2018
Reduction of solder interconnect stress
IBM1 citations63
US7868459B2Jan 11, 2011
Semiconductor package having non-aligned active vias
IBM2 citations63
US6830875B2Dec 14, 2004
Forming a through hole in a photoimageable dielectric structure
IBM3 citations62
US7312523B2Dec 25, 2007
Enhanced via structure for organic module performance
IBM2 citations59
US7982475B2Jul 19, 2011
Structure and method for reliability evaluation of FCPBGA substrates for high power semiconductor packaging applications
IBM4 citations58
US10685919B2Jun 16, 2020
Reduced-warpage laminate structure
IBM0 citations52
US10492289B2Nov 26, 2019
Coating for limiting substrate damage due to discrete failure
IBM0 citations52
US10470290B2Nov 5, 2019
Coating for limiting substrate damage due to discrete failure
IBM0 citations52
US10342122B2Jul 2, 2019
Interface for limiting substrate damage due to discrete failure
IBM0 citations52
US10276535B2Apr 30, 2019
Method of fabricating contacts of an electronic package structure to reduce solder interconnect stress
IBM0 citations52
US10172243B2Jan 1, 2019
Printed circuit board and methods to enhance reliability
IBM0 citations52
US10080283B1Sep 18, 2018
Interface for limiting substrate damage due to discrete failure
IBM0 citations52
US9990707B2Jun 5, 2018
Image analysis methods for plated through hole reliability
IBM0 citations52
US9563732B1Feb 7, 2017
In-plane copper imbalance for warpage prediction
IBM1 citations52
US9484239B2Nov 1, 2016
Sacrificial carrier dicing of semiconductor wafers
IBM0 citations51
US9478453B2Oct 25, 2016
Sacrificial carrier dicing of semiconductor wafers
IBM1 citations51
KACKER KARAN
2 patentsARVIN CHARLES L
1 patentGLOBALFOUNDRIES INC
1 patentShowing the top 50 of 58 patents by PatentIndex Score.