Inventor

CHENG KWANG-TING

US16 patents

⚠️ This page may combine multiple inventors who share the name “CHENG KWANG-TING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LUCENT TECHNOLOGIES INC

4 patents

US5590135ADec 31, 1996

Testing a sequential circuit

LUCENT TECHNOLOGIES INC21 citations91

US5587919ADec 24, 1996

Apparatus and method for logic optimization by redundancy addition and removal

LUCENT TECHNOLOGIES INC25 citations86

US5828828AOct 27, 1998

Method for inserting test points for full-and-partial-scan built-in self-testing

LUCENT TECHNOLOGIES INC12 citations73

US5710711AJan 20, 1998

Method and integrated circuit adapted for partial scan testability

LUCENT TECHNOLOGIES INC8 citations72

VIMA TECHNOLOGIES INC

2 patents

US6976016B2Dec 13, 2005

Maximizing expected generalization for learning complex query concepts

VIMA TECHNOLOGIES INC50 citations95

US7158970B2Jan 2, 2007

Maximizing expected generalization for learning complex query concepts

VIMA TECHNOLOGIES INC27 citations92

AGERE SYSTEMS INC

2 patents

US6694466B1Feb 17, 2004

Method and system for improving the test quality for scan-based BIST using a general test application scheme

AGERE SYSTEMS INC62 citations95

US6256759B1Jul 3, 2001

Hybrid algorithm for test point selection for scan-based BIST

AGERE SYSTEMS INC75 citations95

AT & T BELL LAB

2 patents

US5043986AAug 27, 1991

Method and integrated circuit adapted for partial scan testability

AT & T BELL LAB86 citations95

US5228040AJul 13, 1993

Testable implementations of finite state machines and methods for producing them

AT & T BELL LAB21 citations92

UNIV HONG KONG SCIENCE & TECH

2 patents

US11444124B2Sep 13, 2022

Hybrid memristor/field-effect transistor memory cell and its information encoding scheme

UNIV HONG KONG SCIENCE & TECH3 citations64

US12483626B2Nov 25, 2025

Sensor system

UNIV HONG KONG SCIENCE & TECH0 citations49

UNIV CALIFORNIA

1 patent

US6345373B1Feb 5, 2002

System and method for testing high speed VLSI devices using slower testers

UNIV CALIFORNIA157 citations98

AGERE SYST GUARDIAN CORP

1 patent

US6463561B1Oct 8, 2002

Almost full-scan BIST method and system having higher fault coverage and shorter test application time

AGERE SYST GUARDIAN CORP46 citations92

AT & T CORP

1 patent

US5513122AApr 30, 1996

Method and apparatus for determining the reachable states in a hybrid model state machine

AT & T CORP47 citations92

NEC USA INC

1 patent

US6018813AJan 25, 2000

Identification and test generation for primitive faults

NEC USA INC16 citations83