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Inventor
RUNNING LEIF X
US
4 patents
⚠️ This page may combine multiple inventors who share the name “RUNNING LEIF X”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEKTRONIX INC
3 patents
USD460371S
Jul 16, 2002
Measurement instrument
TEKTRONIX INC
35 citations
91
USD460703S
Jul 23, 2002
Measurement instrument
TEKTRONIX INC
17 citations
90
US6801042B2
Oct 5, 2004
Calibration method and apparatus for signal analysis device
TEKTRONIX INC
23 citations
87
NELSON CRAIG H
1 patent
US8482564B2
Jul 9, 2013
Region overlap control for autorange/autoset functions
NELSON CRAIG H
2 citations
52