P

Inventor

SMITH KENNETH R

US102 patents
⚠️ This page may combine multiple inventors who share the name “SMITH KENNETH R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CASCADE MICROTECH INC

19 patents
US6335628B2Jan 1, 2002

Wafer probe station for low-current measurements

CASCADE MICROTECH INC102 citations99
US6232788B1May 15, 2001

Wafer probe station for low-current measurements

CASCADE MICROTECH INC98 citations99
US5914613AJun 22, 1999

Membrane probing system with local contact scrub

CASCADE MICROTECH INC200 citations98
US5345170ASep 6, 1994

Wafer probe station having integrated guarding, Kelvin connection and shielding systems

CASCADE MICROTECH INC166 citations98
US6930498B2Aug 16, 2005

Membrane probing system

CASCADE MICROTECH INC68 citations97
US6720782B2Apr 13, 2004

Wafer probe station for low-current measurements

CASCADE MICROTECH INC53 citations97
US6492822B2Dec 10, 2002

Wafer probe station for low-current measurements

CASCADE MICROTECH INC64 citations97
US5663653ASep 2, 1997

Wafer probe station for low-current measurements

CASCADE MICROTECH INC91 citations97
US7109731B2Sep 19, 2006

Membrane probing system with local contact scrub

CASCADE MICROTECH INC40 citations96
US6437584B1Aug 20, 2002

Membrane probing system with local contact scrub

CASCADE MICROTECH INC33 citations96
US6307387B1Oct 23, 2001

Membrane probing system with local contact scrub

CASCADE MICROTECH INC28 citations96
US5434512AJul 18, 1995

Wafer probe station having integrated guarding, Kelvin connection and shielding systems

CASCADE MICROTECH INC73 citations96
US7893704B2Feb 22, 2011

Membrane probing structure with laterally scrubbing contacts

CASCADE MICROTECH INC18 citations92
US7888957B2Feb 15, 2011

Probing apparatus with impedance optimized interface

CASCADE MICROTECH INC28 citations92
US7589518B2Sep 15, 2009

Wafer probe station having a skirting component

CASCADE MICROTECH INC10 citations92
US7492147B2Feb 17, 2009

Wafer probe station having a skirting component

CASCADE MICROTECH INC8 citations92
US7330023B2Feb 12, 2008

Wafer probe station having a skirting component

CASCADE MICROTECH INC9 citations92
US7148711B2Dec 12, 2006

Membrane probing system

CASCADE MICROTECH INC25 citations92
US6838890B2Jan 4, 2005

Membrane probing system

CASCADE MICROTECH INC34 citations92

MTD PRODUCTS INC

5 patents

KIMBERLY CLARK CO

4 patents

TEKTRONIX INC

3 patents

EPI TECHNOLOGIES INC

2 patents

SSI MEDICAL SERVICES INC

2 patents

HOUSTON MEDICAL ROBOTICS INC

2 patents

SHELDON JEFFERY J

2 patents

GEOMETRICS

2 patents

KUMMER JOSEPH A

2 patents

HILL ROM CO INC

1 patent

US ARMY

1 patent

SMITH KENNETH R

1 patent

KCI LICENSING INC

1 patent

HILL ROM SERVICES INC

1 patent

CLEANING SYSTEMS INC

1 patent

KROSS INC

1 patent

Showing the top 50 of 102 patents by PatentIndex Score.