Inventor
HOLDEN BLANE
US3 patents
Patents
3 patentsUS6256593B1Jul 3, 2001
System for evaluating and reporting semiconductor test processes
MICRON TECHNOLOGY INC19 citations87
US6113646ASep 5, 2000
Method of selecting layout of integrated circuit probe card
MICRON TECHNOLOGY INC34 citations87
US6070131AMay 30, 2000
System for evaluating and reporting semiconductor test processes
MICRON TECHNOLOGY INC3 citations57