P

Inventor

LEE KUN-TACK

KR57 patents
⚠️ This page may combine multiple inventors who share the name “LEE KUN-TACK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

39 patents
US7488688B2Feb 10, 2009

Method of removing oxide layer and semiconductor manufacturing apparatus for removing oxide layer

SAMSUNG ELECTRONICS CO LTD250 citations97
US8344385B2Jan 1, 2013

Vertical-type semiconductor device

SAMSUNG ELECTRONICS CO LTD43 citations94
US6610596B1Aug 26, 2003

Method of forming metal interconnection using plating and semiconductor device manufactured by the method

SAMSUNG ELECTRONICS CO LTD33 citations93
US6860277B2Mar 1, 2005

Single type of semiconductor wafer cleaning device

SAMSUNG ELECTRONICS CO LTD16 citations92
US6565736B2May 20, 2003

Wet process for semiconductor device fabrication using anode water containing oxidative substances and cathode water containing reductive substances, and anode water and cathode water used in the wet process

SAMSUNG ELECTRONICS CO LTD42 citations92
US6399552B1Jun 4, 2002

Aqueous cleaning solution for removing contaminants surface of circuit substrate cleaning method using the same

SAMSUNG ELECTRONICS CO LTD40 citations92
US10679843B2Jun 9, 2020

Method of treating substrates using supercritical fluids

SAMSUNG ELECTRONICS CO LTD7 citations84
US7498217B2Mar 3, 2009

Methods of manufacturing semiconductor memory devices with unit cells having charge trapping layers

SAMSUNG ELECTRONICS CO LTD9 citations84
US6701942B2Mar 9, 2004

Method of and apparatus for removing contaminants from surface of a substrate

SAMSUNG ELECTRONICS CO LTD15 citations84
US10029332B2Jul 24, 2018

Spot heater and device for cleaning wafer using the same

SAMSUNG ELECTRONICS CO LTD6 citations83
US10083829B2Sep 25, 2018

Apparatus for treating substrates using supercritical fluids, substrate treatment system including the same and method of treating substrates using the same

SAMSUNG ELECTRONICS CO LTD4 citations73
US7237561B2Jul 3, 2007

Apparatus for cleaning semiconductor wafer including heating using a light source and method for cleaning wafer using the same

SAMSUNG ELECTRONICS CO LTD5 citations73
US7153370B2Dec 26, 2006

Method of cleaning semiconductor wafer

SAMSUNG ELECTRONICS CO LTD5 citations73
US7141123B2Nov 28, 2006

Method of and apparatus for removing contaminants from surface of a substrate

SAMSUNG ELECTRONICS CO LTD7 citations73
US10985036B2Apr 20, 2021

Substrate processing apparatus and apparatus for manufacturing integrated circuit device

SAMSUNG ELECTRONICS CO LTD3 citations72
US10576582B2Mar 3, 2020

Spot heater and device for cleaning wafer using the same

SAMSUNG ELECTRONICS CO LTD2 citations72
US7745338B2Jun 29, 2010

Method of forming fine pitch hardmask patterns and method of forming fine patterns of semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD7 citations71
US7857939B2Dec 28, 2010

Apparatus for treating wafers using supercritical fluid

SAMSUNG ELECTRONICS CO LTD4 citations63
US7265040B2Sep 4, 2007

Cleaning solution and method for selectively removing layer in a silicidation process

SAMSUNG ELECTRONICS CO LTD4 citations63
US12042828B2Jul 23, 2024

Wafer cleaning apparatus and wafer cleaning method using the same

SAMSUNG ELECTRONICS CO LTD0 citations62
US11887868B2Jan 30, 2024

Substrate processing apparatus and apparatus for manufacturing integrated circuit device

SAMSUNG ELECTRONICS CO LTD0 citations62
US11648594B2May 16, 2023

Wafer cleaning apparatus and wafer cleaning method using the same

SAMSUNG ELECTRONICS CO LTD0 citations62
US11605545B2Mar 14, 2023

Wafer cleaning equipment

SAMSUNG ELECTRONICS CO LTD1 citations62
US11227761B2Jan 18, 2022

Method of removing chemicals from a substrate

SAMSUNG ELECTRONICS CO LTD0 citations62
US6712078B2Mar 30, 2004

Apparatus for cleaning semiconductor wafer and method for cleaning wafer using the same

SAMSUNG ELECTRONICS CO LTD3 citations62
US12165866B2Dec 10, 2024

Wafer cleaning apparatus and wafer cleaning method using the same

SAMSUNG ELECTRONICS CO LTD0 citations61
US11986921B2May 21, 2024

Chemical mechanical polishing apparatus, chemical mechanical polishing method and method for fabricating semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations60
US11862457B2Jan 2, 2024

Wafer cleaning apparatus, method for cleaning wafer and method for fabricating semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations59
US11581182B2Feb 14, 2023

Wafer cleaning apparatus, method for cleaning wafer and method for fabricating semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations59
US12408323B2Sep 2, 2025

Semiconductor memory device and method for manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations56
US12322587B2Jun 3, 2025

Substrate drying apparatus and semiconductor device manufacturing method using same

SAMSUNG ELECTRONICS CO LTD0 citations52
US9754806B2Sep 5, 2017

Apparatus for treating wafers using supercritical fluid

SAMSUNG ELECTRONICS CO LTD0 citations52
US9394509B2Jul 19, 2016

Cleaning solution composition and method of cleaning semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD0 citations52
US7704828B2Apr 27, 2010

Method of fabricating a semiconductor device

SAMSUNG ELECTRONICS CO LTD1 citations52
US7135413B2Nov 14, 2006

Cleaning solution for removing damaged portion of ferroelectric layer and cleaning method using the same

SAMSUNG ELECTRONICS CO LTD0 citations52
US11721565B2Aug 8, 2023

Multi-chamber apparatus

SAMSUNG ELECTRONICS CO LTD0 citations51
US7959738B2Jun 14, 2011

Method of removing photoresist and method of manufacturing a semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations51
US7825030B2Nov 2, 2010

Method of forming a spacer

SAMSUNG ELECTRONICS CO LTD1 citations51
US7230293B2Jun 12, 2007

Storage nodes of a semiconductor memory

SAMSUNG ELECTRONICS CO LTD0 citations51

LEE HYO-SAN

6 patents

KANG DAE-HYUK

3 patents

CHO YONG-JHIN

1 patent

CHOI JAE-KWANG

1 patent

Showing the top 50 of 57 patents by PatentIndex Score.