Inventor
LEE KUN-TACK
KR57 patents
⚠️ This page may combine multiple inventors who share the name “LEE KUN-TACK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
39 patentsUS7488688B2Feb 10, 2009
Method of removing oxide layer and semiconductor manufacturing apparatus for removing oxide layer
SAMSUNG ELECTRONICS CO LTD250 citations97
US8344385B2Jan 1, 2013
Vertical-type semiconductor device
SAMSUNG ELECTRONICS CO LTD43 citations94
US6610596B1Aug 26, 2003
Method of forming metal interconnection using plating and semiconductor device manufactured by the method
SAMSUNG ELECTRONICS CO LTD33 citations93
US6860277B2Mar 1, 2005
Single type of semiconductor wafer cleaning device
SAMSUNG ELECTRONICS CO LTD16 citations92
US6565736B2May 20, 2003
Wet process for semiconductor device fabrication using anode water containing oxidative substances and cathode water containing reductive substances, and anode water and cathode water used in the wet process
SAMSUNG ELECTRONICS CO LTD42 citations92
US6399552B1Jun 4, 2002
Aqueous cleaning solution for removing contaminants surface of circuit substrate cleaning method using the same
SAMSUNG ELECTRONICS CO LTD40 citations92
US10679843B2Jun 9, 2020
Method of treating substrates using supercritical fluids
SAMSUNG ELECTRONICS CO LTD7 citations84
US7498217B2Mar 3, 2009
Methods of manufacturing semiconductor memory devices with unit cells having charge trapping layers
SAMSUNG ELECTRONICS CO LTD9 citations84
US6701942B2Mar 9, 2004
Method of and apparatus for removing contaminants from surface of a substrate
SAMSUNG ELECTRONICS CO LTD15 citations84
US10029332B2Jul 24, 2018
Spot heater and device for cleaning wafer using the same
SAMSUNG ELECTRONICS CO LTD6 citations83
US10083829B2Sep 25, 2018
Apparatus for treating substrates using supercritical fluids, substrate treatment system including the same and method of treating substrates using the same
SAMSUNG ELECTRONICS CO LTD4 citations73
US7237561B2Jul 3, 2007
Apparatus for cleaning semiconductor wafer including heating using a light source and method for cleaning wafer using the same
SAMSUNG ELECTRONICS CO LTD5 citations73
US7153370B2Dec 26, 2006
Method of cleaning semiconductor wafer
SAMSUNG ELECTRONICS CO LTD5 citations73
US7141123B2Nov 28, 2006
Method of and apparatus for removing contaminants from surface of a substrate
SAMSUNG ELECTRONICS CO LTD7 citations73
US10985036B2Apr 20, 2021
Substrate processing apparatus and apparatus for manufacturing integrated circuit device
SAMSUNG ELECTRONICS CO LTD3 citations72
US10576582B2Mar 3, 2020
Spot heater and device for cleaning wafer using the same
SAMSUNG ELECTRONICS CO LTD2 citations72
US7745338B2Jun 29, 2010
Method of forming fine pitch hardmask patterns and method of forming fine patterns of semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD7 citations71
US7857939B2Dec 28, 2010
Apparatus for treating wafers using supercritical fluid
SAMSUNG ELECTRONICS CO LTD4 citations63
US7265040B2Sep 4, 2007
Cleaning solution and method for selectively removing layer in a silicidation process
SAMSUNG ELECTRONICS CO LTD4 citations63
US12042828B2Jul 23, 2024
Wafer cleaning apparatus and wafer cleaning method using the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US11887868B2Jan 30, 2024
Substrate processing apparatus and apparatus for manufacturing integrated circuit device
SAMSUNG ELECTRONICS CO LTD0 citations62
US11648594B2May 16, 2023
Wafer cleaning apparatus and wafer cleaning method using the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US11605545B2Mar 14, 2023
Wafer cleaning equipment
SAMSUNG ELECTRONICS CO LTD1 citations62
US11227761B2Jan 18, 2022
Method of removing chemicals from a substrate
SAMSUNG ELECTRONICS CO LTD0 citations62
US6712078B2Mar 30, 2004
Apparatus for cleaning semiconductor wafer and method for cleaning wafer using the same
SAMSUNG ELECTRONICS CO LTD3 citations62
US12165866B2Dec 10, 2024
Wafer cleaning apparatus and wafer cleaning method using the same
SAMSUNG ELECTRONICS CO LTD0 citations61
US11986921B2May 21, 2024
Chemical mechanical polishing apparatus, chemical mechanical polishing method and method for fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations60
US11862457B2Jan 2, 2024
Wafer cleaning apparatus, method for cleaning wafer and method for fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations59
US11581182B2Feb 14, 2023
Wafer cleaning apparatus, method for cleaning wafer and method for fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations59
US12408323B2Sep 2, 2025
Semiconductor memory device and method for manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations56
US12322587B2Jun 3, 2025
Substrate drying apparatus and semiconductor device manufacturing method using same
SAMSUNG ELECTRONICS CO LTD0 citations52
US9754806B2Sep 5, 2017
Apparatus for treating wafers using supercritical fluid
SAMSUNG ELECTRONICS CO LTD0 citations52
US9394509B2Jul 19, 2016
Cleaning solution composition and method of cleaning semiconductor device using the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7704828B2Apr 27, 2010
Method of fabricating a semiconductor device
SAMSUNG ELECTRONICS CO LTD1 citations52
US7135413B2Nov 14, 2006
Cleaning solution for removing damaged portion of ferroelectric layer and cleaning method using the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US11721565B2Aug 8, 2023
Multi-chamber apparatus
SAMSUNG ELECTRONICS CO LTD0 citations51
US7959738B2Jun 14, 2011
Method of removing photoresist and method of manufacturing a semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations51
US7825030B2Nov 2, 2010
Method of forming a spacer
SAMSUNG ELECTRONICS CO LTD1 citations51
US7230293B2Jun 12, 2007
Storage nodes of a semiconductor memory
SAMSUNG ELECTRONICS CO LTD0 citations51
LEE HYO-SAN
6 patentsUS8790470B2Jul 29, 2014
Etching, cleaning and drying methods using supercritical fluid and chamber systems using these methods
LEE HYO-SAN8 citations81
US8585917B2Nov 19, 2013
Etching, cleaning and drying methods using supercritical fluid and chamber systems using these methods
LEE HYO-SAN5 citations81
US8084367B2Dec 27, 2011
Etching, cleaning and drying methods using supercritical fluid and chamber systems using these methods
LEE HYO-SAN9 citations81
US8951383B2Feb 10, 2015
Apparatus for treating wafers using supercritical fluid
LEE HYO-SAN2 citations62
US8557651B2Oct 15, 2013
Method of manufacturing a semiconductor device using an etchant
LEE HYO-SAN2 citations62
US8211804B2Jul 3, 2012
Methods of forming a hole having a vertical profile and semiconductor devices having a vertical hole
LEE HYO-SAN2 citations61
KANG DAE-HYUK
3 patentsUS8766343B2Jul 1, 2014
Integrated circuit capacitors having sidewall supports
KANG DAE-HYUK10 citations82
US8119476B2Feb 21, 2012
Methods of forming integrated circuit capacitors having sidewall supports and capacitors formed thereby
KANG DAE-HYUK10 citations82
US8110499B2Feb 7, 2012
Method of forming a contact structure
KANG DAE-HYUK5 citations60
CHO YONG-JHIN
1 patentCHOI JAE-KWANG
1 patentShowing the top 50 of 57 patents by PatentIndex Score.