Inventor
ORIHASHI RITSURO
JP20 patents
⚠️ This page may combine multiple inventors who share the name “ORIHASHI RITSURO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
10 patentsUS5811877ASep 22, 1998
Semiconductor device structure
HITACHI LTD84 citations95
US5438259AAug 1, 1995
Digital circuitry apparatus
HITACHI LTD35 citations90
US7969197B2Jun 28, 2011
Output buffer circuit and differential output buffer circuit, and transmission method
HITACHI LTD13 citations83
US5406198AApr 11, 1995
Digital circuitry apparatus
HITACHI LTD14 citations71
US7692445B2Apr 6, 2010
Output buffer circuit and differential output buffer circuit, and transmission method
HITACHI LTD4 citations62
US4855970AAug 8, 1989
Time interval measurement apparatus
HITACHI LTD2 citations62
US4755758AJul 5, 1988
Wave formatter for a logic circuit testing system
HITACHI LTD6 citations62
US7817362B2Oct 19, 2010
Inspection apparatus and inspection method of magnetic disk or magnetic head
HITACHI LTD1 citations51
US6768953B2Jul 27, 2004
Test apparatus
HITACHI LTD0 citations47
US6697755B2Feb 24, 2004
Test apparatus
HITACHI LTD0 citations47
HITACHI HIGH TECH CORP
5 patentsUS7476850B2Jan 13, 2009
Method and its apparatus for mass spectrometry
HITACHI HIGH TECH CORP9 citations82
US7928365B2Apr 19, 2011
Method and apparatus for mass spectrometry
HITACHI HIGH TECH CORP3 citations61
US7276900B2Oct 2, 2007
Magnetic characteristic inspecting apparatus and inspecting method using it
HITACHI HIGH TECH CORP1 citations51
US7890074B2Feb 15, 2011
Data acquisition system
HITACHI HIGH TECH CORP0 citations50
US7990529B2Aug 2, 2011
Detection circuit and foreign matter inspection apparatus for semiconductor wafer
HITACHI HIGH TECH CORP0 citations41
RENESAS TECH CORP
4 patentsUS7474290B2Jan 6, 2009
Semiconductor device and testing method thereof
RENESAS TECH CORP7 citations72
US7443373B2Oct 28, 2008
Semiconductor device and the method of testing the same
RENESAS TECH CORP6 citations61
US7358953B2Apr 15, 2008
Semiconductor device and testing method of semiconductor device
RENESAS TECH CORP6 citations60
US7668027B2Feb 23, 2010
Semiconductor device, testing and manufacturing methods thereof
RENESAS TECH CORP4 citations58