Inventor

HOSCH JIMMY W

US4 patents

⚠️ This page may combine multiple inventors who share the name “HOSCH JIMMY W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEXAS INSTRUMENTS INC

2 patents

US5361137ANov 1, 1994

Process control for submicron linewidth measurement

TEXAS INSTRUMENTS INC56 citations94

US5422723AJun 6, 1995

Diffraction gratings for submicron linewidth measurement

TEXAS INSTRUMENTS INC39 citations90

HOSCH JIMMY W

1 patent

US9997325B2Jun 12, 2018

Electron beam exciter for use in chemical analysis in processing systems

HOSCH JIMMY W24 citations87

VERITY INSTR INC

1 patent

US6830939B2Dec 14, 2004

System and method for determining endpoint in etch processes using partial least squares discriminant analysis in the time domain of optical emission spectra

VERITY INSTR INC39 citations87