Inventor

CHAN GERALD S

US5 patents

⚠️ This page may combine multiple inventors who share the name “CHAN GERALD S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DOKKEN RICHARD C

2 patents

US8615691B2Dec 24, 2013

Process for improving design-limited yield by localizing potential faults from production test data

DOKKEN RICHARD C5 citations68

US8060851B2Nov 15, 2011

Method for operating a secure semiconductor IP server to support failure analysis

DOKKEN RICHARD C2 citations56

INOVYS CORP

1 patent

US7568139B2Jul 28, 2009

Process for identifying the location of a break in a scan chain in real time

INOVYS CORP21 citations90

VERIGY PTE LTD SINGAPORE

1 patent

US8006149B2Aug 23, 2011

System and method for device performance characterization in physical and logical domains with AC SCAN testing

VERIGY PTE LTD SINGAPORE5 citations60

CHAN GERALD S

1 patent

US8453026B2May 28, 2013

Process for improving design limited yield by efficiently capturing and storing production test data for analysis using checksums, hash values, or digital fault signatures

CHAN GERALD S3 citations54