Inventor
ALBERS BRADLEY J
US3 patents
Patents
3 patentsUS7547560B2Jun 16, 2009
Defect identification system and method for repairing killer defects in semiconductor devices
AGERE SYSTEMS INC8 citations79
US7074628B2Jul 11, 2006
Test structure and method for yield improvement of double poly bipolar device
AGERE SYSTEMS INC1 citations47
US7176781B2Feb 13, 2007
Structure and method for adjusting integrated circuit resistor value
AGERE SYSTEMS INC0 citations39