Inventor
PERDU PHILIPPE
FR13 patents
⚠️ This page may combine multiple inventors who share the name “PERDU PHILIPPE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CENTRE NAT ETD SPATIALES
6 patentsUS7190822B2Mar 13, 2007
Method for customizing an integrated circuit element
CENTRE NAT ETD SPATIALES21 citations92
US6948107B1Sep 20, 2005
Method and installation for fast fault localization in an integrated circuit
CENTRE NAT ETD SPATIALES4 citations62
US6816614B1Nov 9, 2004
Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip
CENTRE NAT ETD SPATIALES4 citations62
US7417424B2Aug 26, 2008
Magnetic-field-measuring device
CENTRE NAT ETD SPATIALES4 citations60
US7411391B2Aug 12, 2008
Magnetic-field-measuring probe
CENTRE NAT ETD SPATIALES2 citations60
US7408342B2Aug 5, 2008
Device for measuring a component of current based on magnetic fields
CENTRE NAT ETD SPATIALES5 citations60
CREDENCE SYSTEMS CORP
6 patentsUS6943572B2Sep 13, 2005
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP15 citations90
US6967491B2Nov 22, 2005
Spatial and temporal selective laser assisted fault localization
CREDENCE SYSTEMS CORP32 citations89
US6891363B2May 10, 2005
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP21 citations89
US7400154B2Jul 15, 2008
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP10 citations82
US7323862B2Jan 29, 2008
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP4 citations72
US7038442B2May 2, 2006
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP5 citations72