Inventor
KASAPI STEVEN
US21 patents
⚠️ This page may combine multiple inventors who share the name “KASAPI STEVEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CREDENCE SYSTEMS CORP
10 patentsUS6836131B2Dec 28, 2004
Spray cooling and transparent cooling plate thermal management system
CREDENCE SYSTEMS CORP58 citations95
US6859031B2Feb 22, 2005
Apparatus and method for dynamic diagnostic testing of integrated circuits
CREDENCE SYSTEMS CORP79 citations94
US7042563B2May 9, 2006
Optical coupling for testing integrated circuits
CREDENCE SYSTEMS CORP35 citations92
US6976234B2Dec 13, 2005
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
CREDENCE SYSTEMS CORP24 citations92
US6891363B2May 10, 2005
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP21 citations89
US7012537B2Mar 14, 2006
Apparatus and method for determining voltage using optical observation
CREDENCE SYSTEMS CORP23 citations88
US7323862B2Jan 29, 2008
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP4 citations72
US7038442B2May 2, 2006
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP5 citations72
US6956365B2Oct 18, 2005
System and method for calibration of testing equipment using device photoemission
CREDENCE SYSTEMS CORP10 citations71
US7227580B2Jun 5, 2007
Knife edge tracking system and method
CREDENCE SYSTEMS CORP0 citations44
DCG SYSTEMS INC
9 patentsUS7990167B2Aug 2, 2011
System and method for modulation mapping
DCG SYSTEMS INC13 citations92
US7733100B2Jun 8, 2010
System and method for modulation mapping
DCG SYSTEMS INC16 citations92
US7450245B2Nov 11, 2008
Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
DCG SYSTEMS INC26 citations91
US7439730B2Oct 21, 2008
Apparatus and method for detecting photon emissions from transistors
DCG SYSTEMS INC10 citations82
US7616312B2Nov 10, 2009
Apparatus and method for probing integrated circuits using laser illumination
DCG SYSTEMS INC12 citations81
US7679358B2Mar 16, 2010
System and method for voltage noise and jitter measurement using time-resolved emission
DCG SYSTEMS INC9 citations80
US9239357B2Jan 19, 2016
System and method for modulation mapping
DCG SYSTEMS INC3 citations73
US7478345B2Jan 13, 2009
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
DCG SYSTEMS INC2 citations62
US9915700B2Mar 13, 2018
System and method for modulation mapping
DCG SYSTEMS INC0 citations52