Inventor · disambiguated record
Che-Lun Hung
Also filed as: HUNG CHE-LUN
3 granted patents·3 pending applications·13 citations·filing 2010–2014
62Inventor score
Top patents by PatentIndex Score
6 records- 0176US8745234B2Method and manager physical machine for virtual machine consolidationLIU HSIAO-FEI·Filed 2010·Granted Jun 3, 2014·10 cites·30 claims
- 0255US8594963B2In-line inspection yield prediction systemLIAO HSIANG-CHOU·Filed 2010·Granted Nov 26, 2013·1 cites·18 claims
- 0350US8329480B2Test pattern for detecting piping in a memory arrayHUNG CHE-LUN·Filed 2010·Granted Dec 11, 2012·2 cites·17 claims
- 0438US2015293169A1Method, systems, and devices for inspecting semiconductor devicesMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 0534US2016041201A1Die structure, contact test structure, and contact testing method utilizing the contact test structureMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
- 0632US2014253137A1Test pattern design for semiconductor devices and method of utilizing thereofMACRONIX INT CO LTD·Filed 2013·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →