P

Inventor

JUN PIL-KWON

KR29 patents
⚠️ This page may combine multiple inventors who share the name “JUN PIL-KWON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

27 patents
US6883248B2Apr 26, 2005

Apparatus for drying a substrate using an isopropyl alcohol vapor

SAMSUNG ELECTRONICS CO LTD26 citations90
US6458518B1Oct 1, 2002

Photoresist stripper composition and method for stripping photoresist using the same

SAMSUNG ELECTRONICS CO LTD15 citations89
US6432622B1Aug 13, 2002

Photoresist stripper composition and method for stripping photoresist using the same

SAMSUNG ELECTRONICS CO LTD21 citations89
US5866305AFeb 2, 1999

Thinner composition for washing a photoresist in a process for preparing semiconductors

SAMSUNG ELECTRONICS CO LTD28 citations88
US6100203AAug 8, 2000

Methods of employing aqueous cleaning compositions in manufacturing microelectronic devices

SAMSUNG ELECTRONICS CO LTD19 citations86
US7951653B1May 31, 2011

Methods of manufacturing a semiconductor device using compositions for etching copper

SAMSUNG ELECTRONICS CO LTD15 citations83
US6959823B2Nov 1, 2005

Wafer guides for processing semiconductor substrates

SAMSUNG ELECTRONICS CO LTD15 citations83
US7311857B2Dec 25, 2007

Etching composition, method of preparing the same, method of etching an oxide film, and method of manufacturing a semiconductor device

SAMSUNG ELECTRONICS CO LTD13 citations81
US6655042B2Dec 2, 2003

System and method for drying semiconductor substrate

SAMSUNG ELECTRONICS CO LTD12 citations72
US6207358B1Mar 27, 2001

Method of stripping a photoresist from a semiconductor substrate using dimethylacetamide or a combination of monoethanolamine and dimethylsulfoxide

SAMSUNG ELECTRONICS CO LTD8 citations72
US7183192B2Feb 27, 2007

Composition for removing photoresist and method of forming a bump electrode in a semiconductor device using the composition

SAMSUNG ELECTRONICS CO LTD7 citations71
US7811836B2Oct 12, 2010

Methods of manufacturing reference sample substrates for analyzing metal contamination levels

SAMSUNG ELECTRONICS CO LTD2 citations62
US7100306B2Sep 5, 2006

Wafer guides for processing semiconductor substrates

SAMSUNG ELECTRONICS CO LTD4 citations62
US6905570B2Jun 14, 2005

Apparatus for manufacturing integrated circuit device

SAMSUNG ELECTRONICS CO LTD5 citations62
US7037852B2May 2, 2006

Composition for stripping photoresist and method of preparing the same

SAMSUNG ELECTRONICS CO LTD2 citations61
US6713440B2Mar 30, 2004

Resist and etching by-product removing composition and resist removing method using the same

SAMSUNG ELECTRONICS CO LTD3 citations61
US6337174B1Jan 8, 2002

Method of stripping a photoresist from a semiconductor substrate dimethylacetamide or a combination of monoethanolamine and dimethylsulfoxide

SAMSUNG ELECTRONICS CO LTD4 citations61
US7985297B2Jul 26, 2011

Method of cleaning a quartz part

SAMSUNG ELECTRONICS CO LTD3 citations60
US7879736B2Feb 1, 2011

Composition for etching silicon oxide and method of forming a contact hole using the same

SAMSUNG ELECTRONICS CO LTD2 citations59
US7223721B2May 29, 2007

Resist and etching by-product removing composition and resist removing method using the same

SAMSUNG ELECTRONICS CO LTD1 citations51
US9528949B2Dec 27, 2016

Methods of detecting inhomogeneity of a layer and apparatus for performing the same

SAMSUNG ELECTRONICS CO LTD1 citations50
US7687448B2Mar 30, 2010

Composition for removing a photoresist, method of preparing the composition, method of removing a photoresist and method of manufacturing a semiconductor device using the composition

SAMSUNG ELECTRONICS CO LTD0 citations49
US7608540B2Oct 27, 2009

Composition for removing a photoresist, method of preparing the composition, method of removing a photoresist and method of manufacturing a semiconductor device using the composition

SAMSUNG ELECTRONICS CO LTD0 citations49
US7678751B2Mar 16, 2010

Composition for removing photoresist, method of removing photoresist and method of manufacturing a semiconductor device using the same

SAMSUNG ELECTRONICS CO LTD1 citations48
US7208454B2Apr 24, 2007

Cleaning solution for removing anti-reflective coating composition

SAMSUNG ELECTRONICS CO LTD0 citations48
US6777379B2Aug 17, 2004

Cleaning solution and method of cleaning anti-reflective coating composition using the same

SAMSUNG ELECTRONICS CO LTD0 citations48
US9638609B2May 2, 2017

Apparatus for providing sample gas and related methods

SAMSUNG ELECTRONICS CO LTD0 citations37

KIM KOOK-JOO

1 patent

NVISANA CO LTD

1 patent