Inventor
MOORS JOHANNES HUBERTUS JOSEPHINA
NL58 patents
⚠️ This page may combine multiple inventors who share the name “MOORS JOHANNES HUBERTUS JOSEPHINA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ASML NETHERLANDS BV
28 patentsUS7462850B2Dec 9, 2008
Radical cleaning arrangement for a lithographic apparatus
ASML NETHERLANDS BV60 citations98
US7473908B2Jan 6, 2009
Getter and cleaning arrangement for a lithographic apparatus and method for cleaning a surface
ASML NETHERLANDS BV22 citations89
US7812330B2Oct 12, 2010
Radical cleaning arrangement for a lithographic apparatus
ASML NETHERLANDS BV8 citations84
US7598503B2Oct 6, 2009
Lithographic apparatus and cleaning method therefor
ASML NETHERLANDS BV11 citations84
US7868304B2Jan 11, 2011
Method for removal of deposition on an optical element, lithographic apparatus, device manufacturing method, and device manufactured thereby
ASML NETHERLANDS BV17 citations83
US11340532B2May 24, 2022
Prolonging optical element lifetime in an EUV lithography system
ASML NETHERLANDS BV5 citations79
US7485881B2Feb 3, 2009
Lithographic apparatus, illumination system, filter system and method for cooling a support of such a filter system
ASML NETHERLANDS BV5 citations74
US7501642B2Mar 10, 2009
Radiation source
ASML NETHERLANDS BV7 citations73
US9411238B2Aug 9, 2016
Source-collector device, lithographic apparatus, and device manufacturing method
ASML NETHERLANDS BV4 citations72
US7897110B2Mar 1, 2011
System and method for detecting at least one contamination species in a lithographic apparatus
ASML NETHERLANDS BV5 citations72
US11294291B2Apr 5, 2022
Lithographic apparatus
ASML NETHERLANDS BV0 citations63
US8345223B2Jan 1, 2013
Optical element, lithographic apparatus including such an optical element, device manufacturing method, and device manufactured thereby
ASML NETHERLANDS BV4 citations63
US7492443B2Feb 17, 2009
Device manufacturing method, device manufactured thereby and a mask for use in the method
ASML NETHERLANDS BV3 citations63
US7459690B2Dec 2, 2008
Lithographic apparatus, device manufacturing method, and device manufactured thereby
ASML NETHERLANDS BV3 citations63
US7684012B2Mar 23, 2010
Lithographic device, device manufacturing method and device manufactured thereby
ASML NETHERLANDS BV2 citations62
US7671347B2Mar 2, 2010
Cleaning method, apparatus and cleaning system
ASML NETHERLANDS BV6 citations62
US8368040B2Feb 5, 2013
Radiation system and lithographic apparatus
ASML NETHERLANDS BV4 citations61
US7935218B2May 3, 2011
Optical apparatus, lithographic apparatus and device manufacturing method
ASML NETHERLANDS BV2 citations60
US7928412B2Apr 19, 2011
Lithographic apparatus, and device manufacturing method
ASML NETHERLANDS BV3 citations60
US7491951B2Feb 17, 2009
Lithographic apparatus, system and device manufacturing method
ASML NETHERLANDS BV2 citations59
US10222702B2Mar 5, 2019
Radiation source
ASML NETHERLANDS BV1 citations58
US11846887B2Dec 19, 2023
Prolonging optical element lifetime in an EUV lithography system
ASML NETHERLANDS BV1 citations57
US8946661B2Feb 3, 2015
Radiation source, lithographic apparatus and device manufacturing method
ASML NETHERLANDS BV1 citations52
US7714306B2May 11, 2010
Lithographic apparatus and device manufacturing method
ASML NETHERLANDS BV0 citations52
US7515245B2Apr 7, 2009
Lithographic apparatus and device manufacturing method
ASML NETHERLANDS BV1 citations52
US10001709B2Jun 19, 2018
Lithographic apparatus, spectral purity filter and device manufacturing method
ASML NETHERLANDS BV0 citations51
US9363879B2Jun 7, 2016
Module and method for producing extreme ultraviolet radiation
ASML NETHERLANDS BV0 citations51
US12117736B2Oct 15, 2024
Lithographic apparatus
ASML NETHERLANDS BV0 citations50
BANINE VADIM YEVGENYEVICH
5 patentsUS8094288B2Jan 10, 2012
Lithographic apparatus and device manufacturing method
BANINE VADIM YEVGENYEVICH4 citations62
US8217347B2Jul 10, 2012
System and method for detecting at least one contamination species in a lithographic apparatus
BANINE VADIM YEVGENYEVICH3 citations61
US9207548B2Dec 8, 2015
Radiation source with a debris mitigation system, lithographic apparatus with a debris mitigation system, method for preventing debris from depositing on collector mirror, and device manufacturing method
BANINE VADIM YEVGENYEVICH1 citations52
US8445873B2May 21, 2013
System and method for detecting at least one contamination species in a lithographic apparatus
BANINE VADIM YEVGENYEVICH0 citations51
US9594306B2Mar 14, 2017
Lithographic apparatus, spectral purity filter and device manufacturing method
BANINE VADIM YEVGENYEVICH0 citations49
ZEISS CARL SMT GMBH
3 patentsUS8382301B2Feb 26, 2013
Optical arrangement, in particular projection exposure apparatus for EUV lithography, as well as reflective optical element with reduced contamination
ZEISS CARL SMT GMBH18 citations91
US8585224B2Nov 19, 2013
Optical arrangement, in particular projection exposure apparatus for EUV lithography, as well as reflective optical element with reduced contamination
ZEISS CARL SMT GMBH11 citations82
US7959310B2Jun 14, 2011
Optical arrangement and EUV lithography device with at least one heated optical element, operating methods, and methods for cleaning as well as for providing an optical element
ZEISS CARL SMT GMBH3 citations54
ASML HOLDING NV
2 patentsEHM DIRK HEINRICH
2 patentsSJMAENOK LEONID AIZIKOVITCH
1 patentSWINKELS GERARDUS HUBERTUS PETRUS MARIA
1 patentDONDERS SJOERD NICOLAAS LAMBERTUS
1 patentVAN MIERLO HUBERT ADRIAAN
1 patentMOORS JOHANNES HUBERTUS JOSEPHINA
1 patentVAN SCHOOT JAN BERNARD PLECHELMUS
1 patentYAKUNIN ANDREI MIKHAILOVICH
1 patentVAN EMPEL TJARKO ADRIAAN RUDOLF
1 patentZEISS CARL SMT AG
1 patentLABETSKI DZMITRY
1 patentShowing the top 50 of 58 patents by PatentIndex Score.