Inventor
ASAKA TOSHIHARU
JP8 patents
⚠️ This page may combine multiple inventors who share the name “ASAKA TOSHIHARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
4 patentsUS5721690AFeb 24, 1998
Logic circuit synthesis
NEC CORP19 citations90
US6189128B1Feb 13, 2001
Design for testability method selectively employing two methods for forming scan paths in a circuit
NEC CORP12 citations71
US6070258AMay 30, 2000
Logic synthesis for testability system which enables improvement in testability and effective selection of center state and logic synthesis method thereof
NEC CORP8 citations71
US6028988AFeb 22, 2000
System for logic synthesis-for-testability capable of improving testability for an FSM having an asynchronous reset state
NEC CORP10 citations71
NEC ELECTRONICS CORP
2 patentsUS7613971B2Nov 3, 2009
Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit
NEC ELECTRONICS CORP43 citations90
US7681096B2Mar 16, 2010
Semiconductor integrated circuit, BIST circuit, design program of BIST circuit, design device of BIST circuit and test method of memory
NEC ELECTRONICS CORP5 citations61