Inventor · disambiguated record
Jang Sup Yoon
Also filed as: YOON JANG SUP
3 granted patents·23 citations·filing 2005–2008
67Inventor score
Files withUNIV FLORIDA3
Top patents by PatentIndex Score
3 records- 0185US7379716B2Embedded IC test circuits and methodsUNIV FLORIDA·Filed 2005·Granted May 27, 2008·15 cites·10 claims
- 0268US7924025B2System, device, and method for embedded S-parameter measurementUNIV FLORIDA·Filed 2006·Granted Apr 12, 2011·6 cites·24 claims
- 0362US7925229B2Power detector of embedded IC test circuitsUNIV FLORIDA·Filed 2008·Granted Apr 12, 2011·2 cites·9 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →