Inventor
PHAM HUNG V
US4 patents
⚠️ This page may combine multiple inventors who share the name “PHAM HUNG V”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PROMETRIX CORP
3 patentsUS5486701AJan 23, 1996
Method and apparatus for measuring reflectance in two wavelength bands to enable determination of thin film thickness
PROMETRIX CORP500 citations98
US4755746AJul 5, 1988
Apparatus and methods for semiconductor wafer testing
PROMETRIX CORP187 citations94
US4945220AJul 31, 1990
Autofocusing system for microscope having contrast detection means
PROMETRIX CORP102 citations93