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Inventor
BRANNIGAN MICHAEL JOSEPH
US
2 patents
Patents
2 patents
US5896040A
Apr 20, 1999
Configurable probe pads to facilitate parallel testing of integrated circuit devices
ST MICROELECTRONICS INC
24 citations
89
US5896039A
Apr 20, 1999
Configurable probe pads to facilitate parallel testing of integrated circuit devices
ST MICROELECTRONICS INC
14 citations
70