P

Inventor

JOHNSON JASON M

US38 patents
⚠️ This page may combine multiple inventors who share the name “JOHNSON JASON M”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

28 patents
US10439612B1Oct 8, 2019

Systems and methods for impedance calibration of a semiconductor device

MICRON TECHNOLOGY INC17 citations94
US10205451B1Feb 12, 2019

Methods and apparatuses for dynamic step size for impedance calibration of a semiconductor device

MICRON TECHNOLOGY INC21 citations94
US10504571B1Dec 10, 2019

Apparatus with a calibration mechanism

MICRON TECHNOLOGY INC29 citations93
US11200939B1Dec 14, 2021

Memory with per die temperature-compensated refresh control

MICRON TECHNOLOGY INC9 citations86
US10593392B1Mar 17, 2020

Apparatuses and methods for multi-bank refresh timing

MICRON TECHNOLOGY INC8 citations81
US11538546B2Dec 27, 2022

Data compression for global column repair

MICRON TECHNOLOGY INC2 citations73
US11508453B2Nov 22, 2022

Encoding test data of microelectronic devices, and related methods, devices, and systems

MICRON TECHNOLOGY INC2 citations73
US10396787B2Aug 27, 2019

Methods and apparatuses for dynamic step size for impedance calibration of a semiconductor device

MICRON TECHNOLOGY INC4 citations73
US10896704B2Jan 19, 2021

Apparatus with a calibration mechanism

MICRON TECHNOLOGY INC2 citations72
US11263078B2Mar 1, 2022

Apparatuses, systems, and methods for error correction

MICRON TECHNOLOGY INC1 citations71
US11183260B1Nov 23, 2021

Transmit line monitoring circuitry, and related methods, devices, and systems

MICRON TECHNOLOGY INC4 citations70
US12548615B2Feb 10, 2026

Apparatuses and methods for repairing multiple bit lines with a same column select value

MICRON TECHNOLOGY INC0 citations62
US11955160B2Apr 9, 2024

Asynchronous signal to command timing calibration for testing accuracy

MICRON TECHNOLOGY INC0 citations62
US11776612B2Oct 3, 2023

Memory with per die temperature-compensated refresh control

MICRON TECHNOLOGY INC0 citations62
US11456049B2Sep 27, 2022

Memory device testing, and associated methods, devices, and systems

MICRON TECHNOLOGY INC0 citations62
US11342042B2May 24, 2022

Interconnected command/address resources

MICRON TECHNOLOGY INC0 citations62
US11264069B2Mar 1, 2022

Apparatus with a calibration mechanism

MICRON TECHNOLOGY INC0 citations62
US10886918B2Jan 5, 2021

Systems and methods for impedance calibration of a semiconductor device

MICRON TECHNOLOGY INC1 citations62
US12079076B2Sep 3, 2024

Apparatuses, systems, and methods for error correction

MICRON TECHNOLOGY INC0 citations61
US12100467B2Sep 24, 2024

Systems and methods for testing redundant fuse latches in a memory device

MICRON TECHNOLOGY INC0 citations60
US11081166B1Aug 3, 2021

Memory device random option inversion

MICRON TECHNOLOGY INC0 citations60
US10923172B2Feb 16, 2021

Apparatuses and methods for multi-bank refresh timing

MICRON TECHNOLOGY INC0 citations60
US12100476B2Sep 24, 2024

Test mode security circuit

MICRON TECHNOLOGY INC0 citations59
US10930327B1Feb 23, 2021

Memory read masking

MICRON TECHNOLOGY INC0 citations58
US11645134B2May 9, 2023

Apparatuses and methods for fuse error detection

MICRON TECHNOLOGY INC0 citations51
US9443615B2Sep 13, 2016

Methods and apparatuses for memory testing with data compression

MICRON TECHNOLOGY INC2 citations51
US11670356B2Jun 6, 2023

Apparatuses and methods for refresh address masking

MICRON TECHNOLOGY INC0 citations50
US10410994B2Sep 10, 2019

Single interconnect index pointer for stacked die address encoding

MICRON TECHNOLOGY INC0 citations36

JOHNSON WILLIAM J

9 patents

LODESTAR LICENSING GROUP LLC

1 patent