Inventor
TANIGUCHI YOSHIFUMI
JP26 patents
⚠️ This page may combine multiple inventors who share the name “TANIGUCHI YOSHIFUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
12 patentsUS7381968B2Jun 3, 2008
Charged particle beam apparatus and specimen holder
HITACHI HIGH TECH CORP28 citations92
USD636005SApr 12, 2011
Electron microscope
HITACHI HIGH TECH CORP11 citations84
US6930306B2Aug 16, 2005
Electron microscope
HITACHI HIGH TECH CORP15 citations84
US7723682B2May 25, 2010
Transmission electron microscope provided with electronic spectroscope
HITACHI HIGH TECH CORP9 citations83
US7235784B2Jun 26, 2007
Transmission electron microscope and image observation method using it
HITACHI HIGH TECH CORP11 citations76
US9679738B2Jun 13, 2017
Electron microscope
HITACHI HIGH TECH CORP3 citations73
US7622714B2Nov 24, 2009
Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus
HITACHI HIGH TECH CORP6 citations73
US9558910B2Jan 31, 2017
Sample holder for electron microscope
HITACHI HIGH TECH CORP3 citations72
US7812310B2Oct 12, 2010
Charged particle beam apparatus and specimen holder
HITACHI HIGH TECH CORP4 citations63
US10636621B2Apr 28, 2020
Charged particle beam device for moving an aperture having plurality of openings and sample observation method
HITACHI HIGH TECH CORP1 citations58
US6855927B2Feb 15, 2005
Method and apparatus for observing element distribution
HITACHI HIGH TECH CORP3 citations58
US10535497B2Jan 14, 2020
Electron microscope and imaging method
HITACHI HIGH TECH CORP0 citations51
HITACHI LTD
8 patentsUS6750451B2Jun 15, 2004
Observation apparatus and observation method using an electron beam
HITACHI LTD32 citations92
US6150657ANov 21, 2000
Energy filter and electron microscope equipped with the energy filter
HITACHI LTD34 citations92
US5981948ANov 9, 1999
Transmission electron microscope and method of observing element distribution
HITACHI LTD21 citations92
US5578823ANov 26, 1996
Transmission electron microscope and method of observing element distribution by using the same
HITACHI LTD25 citations92
US6066852AMay 23, 2000
Electron energy filter
HITACHI LTD11 citations74
US5585630ADec 17, 1996
Electron energy filter and transmission electron microscope provided with the same
HITACHI LTD10 citations74
US7022988B2Apr 4, 2006
Method and apparatus for measuring physical properties of micro region
HITACHI LTD4 citations59
US7385198B2Jun 10, 2008
Method and apparatus for measuring the physical properties of micro region
HITACHI LTD1 citations48
TERADA SHOHEI
3 patentsUS8436301B2May 7, 2013
Transmission electron microscope having electron spectrometer
TERADA SHOHEI3 citations61
US8263936B2Sep 11, 2012
Transmission electron microscope having electron spectroscope
TERADA SHOHEI2 citations61
US8530858B2Sep 10, 2013
Transmission electron microscope apparatus comprising electron spectroscope, sample holder, sample stage, and method for acquiring spectral image
TERADA SHOHEI0 citations40