Inventor
HARADA KEN
JP34 patents
⚠️ This page may combine multiple inventors who share the name “HARADA KEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RIKEN
12 patentsUS7872755B2Jan 18, 2011
Interferometer
RIKEN8 citations82
US7816648B2Oct 19, 2010
Electron interferometer or electron microscope
RIKEN10 citations82
US7750298B2Jul 6, 2010
Interferometer having three electron biprisms
RIKEN10 citations82
US7538323B2May 26, 2009
Interferometer
RIKEN13 citations82
US8785851B2Jul 22, 2014
Interference electron microscope
RIKEN4 citations72
US7808814B2Oct 5, 2010
Magnetization state control device and magnetic information recording device
RIKEN2 citations61
US7655905B2Feb 2, 2010
Charged particle beam equipment
RIKEN6 citations61
US11024482B2Jun 1, 2021
Holography reconstruction method and program
RIKEN0 citations56
US10770264B2Sep 8, 2020
Interference optical system unit, charged particle beam interference apparatus, and method for observing charged particle beam interference image
RIKEN0 citations51
US11551907B2Jan 10, 2023
Electron microscope and sample observation method using the same
RIKEN0 citations46
US10948426B2Mar 16, 2021
Particle beam device, observation method, and diffraction grating
RIKEN0 citations46
US8772715B2Jul 8, 2014
Electron beam device including a first electron biprism to split an electron beam into two beams and a second electron biprism in the image forming lens system to superpose the two beams
RIKEN0 citations40
HITACHI LTD
6 patentsUS7923685B2Apr 12, 2011
Electron beam device
HITACHI LTD9 citations83
US6838675B2Jan 4, 2005
Specimen observation system for applying external magnetic field
HITACHI LTD14 citations83
US7939801B2May 10, 2011
Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method
HITACHI LTD3 citations62
US7999652B2Aug 16, 2011
Thick film resistor
HITACHI LTD2 citations57
US10210962B2Feb 19, 2019
Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating
HITACHI LTD1 citations55
US11011344B2May 18, 2021
Interferometric electron microscope
HITACHI LTD0 citations50
MITSUBISHI CHEM CORP
5 patentsUS11066627B2Jul 20, 2021
Cleaning agent composition for semiconductor device substrate, method of cleaning semiconductor device substrate, method of manufacturing semiconductor device substrate, and semiconductor device substrate
MITSUBISHI CHEM CORP0 citations62
US11597896B2Mar 7, 2023
Cleaning liquid, cleaning method, and method for producing semiconductor wafer
MITSUBISHI CHEM CORP0 citations59
US11149231B2Oct 19, 2021
Cleaning liquid, cleaning method, and method for producing semiconductor wafer
MITSUBISHI CHEM CORP0 citations53
US10113141B2Oct 30, 2018
Cleaning liquid for semiconductor device and method for cleaning substrate for semiconductor device
MITSUBISHI CHEM CORP0 citations52
US9365802B2Jun 14, 2016
Cleaning liquid for semiconductor device substrates and method of cleaning substrate for semiconductor devices
MITSUBISHI CHEM CORP1 citations52
HARADA KEN
4 patentsUS8193494B2Jun 5, 2012
Transmission electron microscope and method for observing specimen image with the same
HARADA KEN7 citations83
US8946628B2Feb 3, 2015
Electron beam interference device and electron beam interferometry
HARADA KEN9 citations82
US9864114B2Jan 9, 2018
Zone plate having annular or spiral shape and Y-shaped branching edge dislocation
HARADA KEN0 citations50
US8653472B2Feb 18, 2014
Electromagnetic field application system
HARADA KEN1 citations50