Inventor
HAGLEITNER HELMUT
US33 patents
⚠️ This page may combine multiple inventors who share the name “HAGLEITNER HELMUT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CREE INC
21 patentsUS7125786B2Oct 24, 2006
Method of forming vias in silicon carbide and resulting devices and circuits
CREE INC121 citations98
US6794684B2Sep 21, 2004
Reflective ohmic contacts for silicon carbide including a layer consisting essentially of nickel, methods of fabricating same, and light emitting devices including the same
CREE INC133 citations98
US7892974B2Feb 22, 2011
Method of forming vias in silicon carbide and resulting devices and circuits
CREE INC80 citations97
US7525122B2Apr 28, 2009
Passivation of wide band-gap based semiconductor devices with hydrogen-free sputtered nitrides
CREE INC22 citations92
US6998322B2Feb 14, 2006
Methods of fabricating high voltage, high temperature capacitor and interconnection structures
CREE INC16 citations92
US6972436B2Dec 6, 2005
High voltage, high temperature capacitor and interconnection structures
CREE INC39 citations92
US9812338B2Nov 7, 2017
Encapsulation of advanced devices using novel PECVD and ALD schemes
CREE INC8 citations83
US7858460B2Dec 28, 2010
Passivation of wide band-gap based semiconductor devices with hydrogen-free sputtered nitrides
CREE INC10 citations83
US7875545B2Jan 25, 2011
Silicon-rich nickel-silicide ohmic contacts for SiC semiconductor devices
CREE INC14 citations79
US9640623B2May 2, 2017
Semiconductor device with improved field plate
CREE INC2 citations73
US9202703B2Dec 1, 2015
Ni-rich Schottky contact
CREE INC5 citations72
US9608078B2Mar 28, 2017
Semiconductor device with improved field plate
CREE INC2 citations71
US9536783B2Jan 3, 2017
Wafer-level die attach metallization
CREE INC2 citations71
US8970010B2Mar 3, 2015
Wafer-level die attach metallization
CREE INC5 citations70
US9343543B2May 17, 2016
Gate contact for a semiconductor device and methods of fabrication thereof
CREE INC2 citations63
US8994073B2Mar 31, 2015
Hydrogen mitigation schemes in the passivation of advanced devices
CREE INC2 citations63
US10367074B2Jul 30, 2019
Method of forming vias in silicon carbide and resulting devices and circuits
CREE INC0 citations52
US8994182B2Mar 31, 2015
Dielectric solder barrier for semiconductor devices
CREE INC1 citations52
US8969927B2Mar 3, 2015
Gate contact for a semiconductor device and methods of fabrication thereof
CREE INC0 citations52
US10090394B2Oct 2, 2018
Ohmic contact structure for group III nitride semiconductor device having improved surface morphology and well-defined edge features
CREE INC0 citations50
US9269662B2Feb 23, 2016
Using stress reduction barrier sub-layers in a semiconductor die
CREE INC0 citations41
MIECZKOWSKI VAN
5 patentsUS9142631B2Sep 22, 2015
Multilayer diffusion barriers for wide bandgap Schottky barrier devices
MIECZKOWSKI VAN4 citations72
US8896122B2Nov 25, 2014
Semiconductor devices having gates including oxidized nickel
MIECZKOWSKI VAN4 citations72
US8907350B2Dec 9, 2014
Semiconductor devices having improved adhesion and methods of fabricating the same
MIECZKOWSKI VAN5 citations71
US9607955B2Mar 28, 2017
Contact pad
MIECZKOWSKI VAN0 citations50
US10020244B2Jul 10, 2018
Polymer via plugs with high thermal integrity
MIECZKOWSKI VAN0 citations48
HAGLEITNER HELMUT
4 patentsUS9214352B2Dec 15, 2015
Ohmic contact to semiconductor device
HAGLEITNER HELMUT34 citations92
US8563372B2Oct 22, 2013
Methods of forming contact structures including alternating metal and silicon layers and related devices
HAGLEITNER HELMUT40 citations92
US9548206B2Jan 17, 2017
Ohmic contact structure for group III nitride semiconductor device having improved surface morphology and well-defined edge features
HAGLEITNER HELMUT4 citations71
US9640627B2May 2, 2017
Schottky contact
HAGLEITNER HELMUT0 citations51