Inventor

LIN CHIH-JEN M

US3 patents

Patents

3 patents

US8028209B2Sep 27, 2011

Scalable scan system for system-on-chip design

INTEL CORP15 citations77

US7370249B2May 6, 2008

Method and apparatus for testing a memory array

INTEL CORP3 citations58

US7216274B2May 8, 2007

Flexible scan architecture

INTEL CORP3 citations57