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Inventor
HALAVIATI RAMIN
US
2 patents
Patents
2 patents
US5175495A
Dec 29, 1992
Detection of semiconductor failures by photoemission and electron beam testing
LSI LOGIC CORP
60 citations
90
US5325309A
Jun 28, 1994
Method and apparatus for integrated circuit diagnosis
LSI LOGIC CORP
98 citations
88