Inventor
SUKMAN-PRAEHOFER SIBINA
DE3 patents
Patents
3 patentsUS7372072B2May 13, 2008
Semiconductor wafer with test structure
INFINEON TECHNOLOGIES AG8 citations66
US7126154B2Oct 24, 2006
Test structure for a single-sided buried strap DRAM memory cell array
INFINEON TECHNOLOGIES AG2 citations54
US7205567B2Apr 17, 2007
Semiconductor product having a semiconductor substrate and a test structure and method
INFINEON TECHNOLOGIES AG1 citations48