Inventor

YOSHIMITSU YASURO

JP5 patents

⚠️ This page may combine multiple inventors who share the name “YOSHIMITSU YASURO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NIHON DENSHIZAIRYO KK

2 patents

US5134365AJul 28, 1992

Probe card in which contact pressure and relative position of each probe end are correctly maintained

NIHON DENSHIZAIRYO KK115 citations94

US5055778AOct 8, 1991

Probe card in which contact pressure and relative position of each probe end are correctly maintained

NIHON DENSHIZAIRYO KK97 citations94

JAPAN ELECTRONIC MATERIALS

2 patents

US4523144AJun 11, 1985

Complex probe card for testing a semiconductor wafer

JAPAN ELECTRONIC MATERIALS118 citations94

US4518914AMay 21, 1985

Testing apparatus of semiconductor wafers

JAPAN ELECTRONIC MATERIALS61 citations93

NIHON DENSHI ZAIRO KABUSHIKI K

1 patent

US4567433AJan 28, 1986

Complex probe card for testing a semiconductor wafer

NIHON DENSHI ZAIRO KABUSHIKI K141 citations94