Inventor
CHEN HUNG-JEN
TW47 patents
⚠️ This page may combine multiple inventors who share the name “CHEN HUNG-JEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CHENG UEI PREC IND CO LTD
15 patentsUSD612368SMar 23, 2010
Double-band antenna
CHENG UEI PREC IND CO LTD143 citations97
USD608354SJan 19, 2010
Double-band antenna
CHENG UEI PREC IND CO LTD20 citations92
US7466272B1Dec 16, 2008
Dual-band antenna
CHENG UEI PREC IND CO LTD19 citations92
US7557759B2Jul 7, 2009
Integrated multi-band antenna
CHENG UEI PREC IND CO LTD14 citations84
US7358903B1Apr 15, 2008
Triple-band embedded antenna
CHENG UEI PREC IND CO LTD12 citations84
US7965239B2Jun 21, 2011
Antenna structure
CHENG UEI PREC IND CO LTD7 citations83
USD609224SFeb 2, 2010
Antenna
CHENG UEI PREC IND CO LTD9 citations83
US7764246B2Jul 27, 2010
Wireless device and method for improving antenna characteristic of the wireless device
CHENG UEI PREC IND CO LTD16 citations82
US7304616B1Dec 4, 2007
Antenna structure of mobile phone
CHENG UEI PREC IND CO LTD12 citations81
US7728783B2Jun 1, 2010
Antenna structure
CHENG UEI PREC IND CO LTD7 citations74
USD580917SNov 18, 2008
Antenna apparatus
CHENG UEI PREC IND CO LTD6 citations72
USD555155SNov 13, 2007
Multi-band antenna
CHENG UEI PREC IND CO LTD6 citations72
US7619572B2Nov 17, 2009
Dual band antenna
CHENG UEI PREC IND CO LTD4 citations63
US7642972B1Jan 5, 2010
Antenna
CHENG UEI PREC IND CO LTD4 citations57
US7936315B2May 3, 2011
Antenna system and method for making the same
CHENG UEI PREC IND CO LTD1 citations50
MATERIALS ANALYSIS TECH INC
11 patentsUS11959834B2Apr 16, 2024
Manufacturing method of sample collection component
MATERIALS ANALYSIS TECH INC0 citations59
US11291991B2Apr 5, 2022
Sample carrier device and method for operating the same
MATERIALS ANALYSIS TECH INC0 citations51
US11282669B2Mar 22, 2022
Carrier device and carrier kit
MATERIALS ANALYSIS TECH INC0 citations51
US10267713B2Apr 23, 2019
Sample preparation system and preparation method for an electron microscope
MATERIALS ANALYSIS TECH INC0 citations51
US10309875B2Jun 4, 2019
Sample collection component and manufacturing method thereof
MATERIALS ANALYSIS TECH INC0 citations48
US11955312B2Apr 9, 2024
Physical analysis method, sample for physical analysis and preparing method thereof
MATERIALS ANALYSIS TECH INC0 citations47
US12361530B2Jul 15, 2025
Curve alignment method and curve alignment apparatus
MATERIALS ANALYSIS TECH INC0 citations41
US11946945B2Apr 2, 2024
Sample analyzing method and sample preparing method
MATERIALS ANALYSIS TECH INC0 citations41
US10379075B2Aug 13, 2019
Sample collection device and manufacturing method thereof
MATERIALS ANALYSIS TECH INC0 citations41
US12154775B2Nov 26, 2024
Analysis system, auxiliary analysis apparatus and analysis method
MATERIALS ANALYSIS TECH INC0 citations37
US12260541B2Mar 25, 2025
Soldering quality inspection method and soldering quality inspection apparatus
MATERIALS ANALYSIS TECH INC0 citations35
MEDIATEK INC
5 patentsUS11115595B2Sep 7, 2021
Privacy-aware image encryption
MEDIATEK INC1 citations61
US11004232B2May 11, 2021
Method and apparatus for performing object detection according to bounding box distribution that is determined by considering lens configuration
MEDIATEK INC0 citations60
US9851446B2Dec 26, 2017
GNSS receiver and method for determining whether to switch from one operation state to another operation state according to state switching criterion and positioning information
MEDIATEK INC0 citations50
US10148867B2Dec 4, 2018
Camera auto-focus apparatus for performing lens position compensation to determine focused lens position and related camera auto-focus method
MEDIATEK INC0 citations44
US9729776B2Aug 8, 2017
Camera auto-focus apparatus for performing lens position compensation to determine focused lens position and related camera auto-focus method
MEDIATEK INC0 citations44