Inventor

LAI FU-KANG

TW2 patents

Patents

2 patents

US6931296B2Aug 16, 2005

Algorithms tunning for dynamic lot dispatching in wafer and chip probing

TAIWAN SEMICONDUCTOR MFG15 citations78

US6480794B1Nov 12, 2002

Method for minimizing total test time for testing factories

TAIWAN SEMICONDUCTOR MFG8 citations69