Inventor · disambiguated record

Manyoung Shin

Also filed as: SHIN MANYOUNG

2 granted patents·7 citations·filing 2015–2017

46Inventor score

Technology areasG06F H10P

Files withSAMSUNG ELECTRONICS CO LTD2

Top patents by PatentIndex Score

2 records

0180US9658949B2Test system of system on chip and test method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted May 23, 2017·7 cites·20 claims
0239US10424497B2Wafer carrierSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Sep 24, 2019·0 cites·20 claims

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Manyoung Shin — Patent Inventor | PatentIndex