Inventor
FLEISCHER HANS-JUERGEN
DE2 patents
Patents
2 patentsUS7057408B2Jun 6, 2006
Method and prober for contacting a contact area with a contact tip
SUSS MICROTEC TEST SYS GMBH11 citations81
US7265536B2Sep 4, 2007
Procedure for reproduction of a calibration position of an aligned and afterwards displaced calibration substrate in a probe station
SUSS MICROTEC TEST SYS GMBH1 citations46