Inventor
RYU JAE WOO
KR38 patents
⚠️ This page may combine multiple inventors who share the name “RYU JAE WOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG DISPLAY CO LTD
22 patentsUS11062660B1Jul 13, 2021
Display device and method of compensating for degradation of the display device
SAMSUNG DISPLAY CO LTD5 citations83
US10997883B2May 4, 2021
Display panel crack detector, display device, and method for driving display device
SAMSUNG DISPLAY CO LTD9 citations80
US11741878B2Aug 29, 2023
Display device using rewrite image data dependent on an initialization voltage during a vertical blank period
SAMSUNG DISPLAY CO LTD4 citations74
US11632046B2Apr 18, 2023
Power voltage generator and display device having the same
SAMSUNG DISPLAY CO LTD3 citations73
US11574591B2Feb 7, 2023
Display device
SAMSUNG DISPLAY CO LTD2 citations73
US11349392B2May 31, 2022
Power voltage generator and display device having the same
SAMSUNG DISPLAY CO LTD2 citations73
US11158265B2Oct 26, 2021
Scan driver and display device including the same
SAMSUNG DISPLAY CO LTD3 citations73
US10984718B2Apr 20, 2021
Display device and driving method thereof
SAMSUNG DISPLAY CO LTD2 citations73
US12165558B2Dec 10, 2024
Display device
SAMSUNG DISPLAY CO LTD0 citations62
US11893927B2Feb 6, 2024
Display device and method of driving the same
SAMSUNG DISPLAY CO LTD0 citations62
US11705075B2Jul 18, 2023
Display device and method of compensating for degradation of the display device
SAMSUNG DISPLAY CO LTD0 citations62
US11574574B2Feb 7, 2023
Display device and method of driving the same
SAMSUNG DISPLAY CO LTD1 citations62
US11398192B2Jul 26, 2022
Display device and method of compensating for degradation of the display device
SAMSUNG DISPLAY CO LTD0 citations62
US11107417B1Aug 31, 2021
Display panel driving device, display device, and driving method thereof
SAMSUNG DISPLAY CO LTD0 citations62
US10950207B2Mar 16, 2021
Display device and method for displaying images using a display device
SAMSUNG DISPLAY CO LTD0 citations62
US11132949B2Sep 28, 2021
Compensation method of display device
SAMSUNG DISPLAY CO LTD1 citations61
US12062339B2Aug 13, 2024
Display device
SAMSUNG DISPLAY CO LTD0 citations60
US11862102B2Jan 2, 2024
Display device
SAMSUNG DISPLAY CO LTD0 citations60
US11205368B2Dec 21, 2021
Display device and method of driving the same
SAMSUNG DISPLAY CO LTD1 citations60
US11594167B2Feb 28, 2023
Display device and driving method thereof
SAMSUNG DISPLAY CO LTD0 citations57
US12112682B2Oct 8, 2024
Display apparatus and method of driving display panel using the same
SAMSUNG DISPLAY CO LTD0 citations50
US11984057B2May 14, 2024
Display device, and method of operating a display device
SAMSUNG DISPLAY CO LTD0 citations50
GLOBALWAFERS CO LTD
8 patentsUS11111597B2Sep 7, 2021
Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method
GLOBALWAFERS CO LTD9 citations85
US11111596B2Sep 7, 2021
Single crystal silicon ingot having axial uniformity
GLOBALWAFERS CO LTD3 citations72
US11680335B2Jun 20, 2023
Single crystal silicon ingot having axial uniformity
GLOBALWAFERS CO LTD0 citations62
US11680336B2Jun 20, 2023
Methods for growing a nitrogen doped single crystal silicon ingot using continuous Czochralski method
GLOBALWAFERS CO LTD0 citations62
US10513796B2Dec 24, 2019
Methods for producing low oxygen silicon ingots
GLOBALWAFERS CO LTD1 citations61
US12024789B2Jul 2, 2024
Methods for forming single crystal silicon ingots with improved resistivity control
GLOBALWAFERS CO LTD0 citations59
US11313049B2Apr 26, 2022
Crystal pulling systems and methods for producing monocrystalline ingots with reduced edge band defects
GLOBALWAFERS CO LTD1 citations59
US11072870B2Jul 27, 2021
Crystal pulling systems and methods for producing monocrystalline ingots with reduced edge band defects
GLOBALWAFERS CO LTD0 citations59
SUNEDISON SEMICONDUCTOR LTD
2 patentsSUNEDISON SEMICONDUCTOR LTD UEN201334164H
2 patentsUS10453703B2Oct 22, 2019
Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield
SUNEDISON SEMICONDUCTOR LTD UEN201334164H1 citations59
US10707093B2Jul 7, 2020
Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yield
SUNEDISON SEMICONDUCTOR LTD UEN201334164H0 citations49