Inventor

EGERT WOLFGANG

DE2 patents

⚠️ This page may combine multiple inventors who share the name “EGERT WOLFGANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

1 patent

US5798525AAug 25, 1998

X-ray enhanced SEM critical dimension measurement

IBM34 citations87

HITACHI GLOBAL STORAGE TECH

1 patent

US6844144B2Jan 18, 2005

Single slider air bearing process using polymer brush formation

HITACHI GLOBAL STORAGE TECH10 citations69